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Title: Temperature field analysis of single layer TiO{sub 2} film components induced by long-pulse and short-pulse lasers

Abstract

To study the differences between the damaging of thin film components induced by long-pulse and short-pulse lasers, a model of single layer TiO{sub 2} film components with platinum high-absorptance inclusions was established. The temperature rises of TiO{sub 2} films with inclusions of different sizes and different depths induced by a 1 ms long-pulse and a 10 ns short-pulse lasers were analyzed based on temperature field theory. The results show that there is a radius range of inclusions that corresponds to high temperature rises. Short-pulse lasers are more sensitive to high-absorptance inclusions and long-pulse lasers are more easily damage the substrate. The first-damage decision method is drawn from calculations.

Authors:
; ; ; ; ; ;
Publication Date:
OSTI Identifier:
22036639
Resource Type:
Journal Article
Journal Name:
Applied Optics
Additional Journal Information:
Journal Volume: 50; Journal Issue: 20; Other Information: (c) 2011 Optical Society of America; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6935
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; FIELD THEORIES; INCLUSIONS; LASER RADIATION; LAYERS; PLATINUM; PULSES; SUBSTRATES; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT; THIN FILMS; TITANIUM OXIDES

Citation Formats

Wang Bin, Zhang Hongchao, Qin Yuan, Wang Xi, Ni Xiaowu, Shen Zhonghua, and Lu Jian. Temperature field analysis of single layer TiO{sub 2} film components induced by long-pulse and short-pulse lasers. United States: N. p., 2011. Web. doi:10.1364/AO.50.003435.
Wang Bin, Zhang Hongchao, Qin Yuan, Wang Xi, Ni Xiaowu, Shen Zhonghua, & Lu Jian. Temperature field analysis of single layer TiO{sub 2} film components induced by long-pulse and short-pulse lasers. United States. doi:10.1364/AO.50.003435.
Wang Bin, Zhang Hongchao, Qin Yuan, Wang Xi, Ni Xiaowu, Shen Zhonghua, and Lu Jian. Sun . "Temperature field analysis of single layer TiO{sub 2} film components induced by long-pulse and short-pulse lasers". United States. doi:10.1364/AO.50.003435.
@article{osti_22036639,
title = {Temperature field analysis of single layer TiO{sub 2} film components induced by long-pulse and short-pulse lasers},
author = {Wang Bin and Zhang Hongchao and Qin Yuan and Wang Xi and Ni Xiaowu and Shen Zhonghua and Lu Jian},
abstractNote = {To study the differences between the damaging of thin film components induced by long-pulse and short-pulse lasers, a model of single layer TiO{sub 2} film components with platinum high-absorptance inclusions was established. The temperature rises of TiO{sub 2} films with inclusions of different sizes and different depths induced by a 1 ms long-pulse and a 10 ns short-pulse lasers were analyzed based on temperature field theory. The results show that there is a radius range of inclusions that corresponds to high temperature rises. Short-pulse lasers are more sensitive to high-absorptance inclusions and long-pulse lasers are more easily damage the substrate. The first-damage decision method is drawn from calculations.},
doi = {10.1364/AO.50.003435},
journal = {Applied Optics},
issn = {0003-6935},
number = 20,
volume = 50,
place = {United States},
year = {2011},
month = {7}
}