At-wavelength characterization of refractive x-ray lenses using a two-dimensional grating interferometer

Journal Article · Mon Nov 28 00:00:00 EST 2011 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3665063· OSTI ID:22027821

Rutishauser, Simon; David, Christian ^[1]; Zanette, Irene ^[2]; Weitkamp, Timm ^[3]; Donath, Tilman ^[1]; Dectris Ltd, 5400 Baden ^[4]

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1. Paul Scherrer Institut, 5232 Villigen PSI (Switzerland)
2. European Synchrotron Radiation Facility, 38043 Grenoble (France)
3. Synchrotron Soleil, 91192 Gif-sur-Yvette (France)
4. Switzerland

We report on the application of a two-dimensional hard x-ray grating interferometer to x-ray optics metrology. The interferometer is sensitive to refraction angles in two perpendicular directions with a precision of 10 nrad. It is used to observe the wavefront changes induced by a single parabolic beryllium focusing lens of large radius of curvature. The lens shape is reconstructed and its residual aberrations are analyzed. Its profile differs from an ideal parabolic shape by less than 2 {mu}m or {lambda}/50 at {lambda} = 0.54 A wavelength.

• OSTI ID: 22027821
• Journal Information: Applied Physics Letters, Vol. 99, Issue 22; Other Information: (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BERYLLIUM
DIFFRACTION GRATINGS
FOCUSING
HARD X RADIATION
INTERFEROMETERS
LENSES
OPTICS
REFRACTION
REFRACTIVE INDEX
WAVELENGTHS