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Title: Preparation and characterization of RF sputtered Ce-V mixed oxide thin films

Abstract

Cerium-Vanadium mixed oxide thin films were deposited at room temperature by varying RF power in RF magnetron sputtering. The morphology and structural features were studied by taking FESEM and XRD and optical properties were analyzed by taking transmittance and absorption spectra. The crystalline film shows orthorhombic CeVO{sub 3} phase and the observed grain size varies from 89.4nm to 208.7nm. The transmission increases and the absorption edge at 330nm is blue shifted with increase in RF power. The optical band gap is found to increase from 1.59 to 1.94eV. The PL spectra shows blue shift in the emission peak centered at a wavelength of 495nm with increase in RF power.

Authors:
;  [1];  [2]
  1. Department of Physics, N. M. S. Sermathai Vasan College, Madurai-625 012 (India)
  2. (India)
Publication Date:
OSTI Identifier:
22004127
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1447; Journal Issue: 1; Conference: 56. DAE solid state physics symposium 2011, Kattankulathur, Tamilnadu (India), 19-23 Dec 2011; Other Information: (c) 2012 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION SPECTRA; CERIUM COMPOUNDS; EMISSION SPECTROSCOPY; ENERGY GAP; FIELD EMISSION; GRAIN SIZE; INFRARED SPECTRA; MORPHOLOGY; OPTICAL PROPERTIES; ORTHORHOMBIC LATTICES; PHOTOLUMINESCENCE; SCANNING ELECTRON MICROSCOPY; SPECTRAL SHIFT; THIN FILMS; ULTRAVIOLET SPECTRA; VANADATES; VISIBLE SPECTRA; X-RAY DIFFRACTION

Citation Formats

Malini, D. Rachel, Sanjeeviraja, C., and School of Physics, Alagappa University, Karaikudi-630 003. Preparation and characterization of RF sputtered Ce-V mixed oxide thin films. United States: N. p., 2012. Web. doi:10.1063/1.4710162.
Malini, D. Rachel, Sanjeeviraja, C., & School of Physics, Alagappa University, Karaikudi-630 003. Preparation and characterization of RF sputtered Ce-V mixed oxide thin films. United States. doi:10.1063/1.4710162.
Malini, D. Rachel, Sanjeeviraja, C., and School of Physics, Alagappa University, Karaikudi-630 003. Tue . "Preparation and characterization of RF sputtered Ce-V mixed oxide thin films". United States. doi:10.1063/1.4710162.
@article{osti_22004127,
title = {Preparation and characterization of RF sputtered Ce-V mixed oxide thin films},
author = {Malini, D. Rachel and Sanjeeviraja, C. and School of Physics, Alagappa University, Karaikudi-630 003},
abstractNote = {Cerium-Vanadium mixed oxide thin films were deposited at room temperature by varying RF power in RF magnetron sputtering. The morphology and structural features were studied by taking FESEM and XRD and optical properties were analyzed by taking transmittance and absorption spectra. The crystalline film shows orthorhombic CeVO{sub 3} phase and the observed grain size varies from 89.4nm to 208.7nm. The transmission increases and the absorption edge at 330nm is blue shifted with increase in RF power. The optical band gap is found to increase from 1.59 to 1.94eV. The PL spectra shows blue shift in the emission peak centered at a wavelength of 495nm with increase in RF power.},
doi = {10.1063/1.4710162},
journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1447,
place = {United States},
year = {2012},
month = {6}
}