Hard X-ray Phase-Contrast Tomographic Nanoimaging
- Paul Scherrer Institut, 5232 Villigen (Switzerland)
- EMPA, Swiss Federal Laboratories for Materials Science and Technology, 8600 Duebendorf (Switzerland)
Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with a 3D isotropic resolution of 144 nm recently installed at the TOMCAT beamline of the Swiss Light Source. Custom optical components, including a beam-shaping condenser and phase-shifting dot arrays, were used to obtain an ideal, aperture-matched sample illumination and very sensitive phase-contrast imaging. The instrument has been successfully used for the nondestructive, volumetric investigation of single, unstained cells.
- OSTI ID:
- 21608288
- Journal Information:
- AIP Conference Proceedings, Vol. 1365, Issue 1; Conference: 10. international conference on X-ray microscopy, Chicago, IL (United States), 15-20 Aug 2010; Other Information: DOI: 10.1063/1.3625348; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ANTENNAS
APERTURES
BEAM OPTICS
BEAM SHAPING
BEAM TRANSPORT
HARD X RADIATION
ILLUMINANCE
KEV RANGE
MICROSCOPY
SOFT X RADIATION
SPATIAL RESOLUTION
SWISS LIGHT SOURCE
SYNCHROTRON RADIATION
SYNCHROTRONS
TOMOGRAPHY
X-RAY SOURCES
ACCELERATORS
BREMSSTRAHLUNG
CYCLIC ACCELERATORS
DIAGNOSTIC TECHNIQUES
ELECTRICAL EQUIPMENT
ELECTROMAGNETIC RADIATION
ENERGY RANGE
EQUIPMENT
IONIZING RADIATIONS
OPENINGS
RADIATION SOURCES
RADIATIONS
RESOLUTION
SYNCHROTRON RADIATION SOURCES
X RADIATION