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Title: Hard X-ray Phase-Contrast Tomographic Nanoimaging

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3625348· OSTI ID:21608288
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  1. Paul Scherrer Institut, 5232 Villigen (Switzerland)
  2. EMPA, Swiss Federal Laboratories for Materials Science and Technology, 8600 Duebendorf (Switzerland)

Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with a 3D isotropic resolution of 144 nm recently installed at the TOMCAT beamline of the Swiss Light Source. Custom optical components, including a beam-shaping condenser and phase-shifting dot arrays, were used to obtain an ideal, aperture-matched sample illumination and very sensitive phase-contrast imaging. The instrument has been successfully used for the nondestructive, volumetric investigation of single, unstained cells.

OSTI ID:
21608288
Journal Information:
AIP Conference Proceedings, Vol. 1365, Issue 1; Conference: 10. international conference on X-ray microscopy, Chicago, IL (United States), 15-20 Aug 2010; Other Information: DOI: 10.1063/1.3625348; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English