skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: The X-ray Fluorescence Microscopy Beamline at the Australian Synchrotron

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3625343· OSTI ID:21608286
; ; ; ; ; ;  [1]; ; ;  [2];  [3]
  1. Australian Synchrotron, Clayton, VIC 3168 (Australia)
  2. CSIRO, Clayton VIC, 3168 (Australia)
  3. Instrumentation Division, Brookhaven National Laboratory, Brookhaven, NY (United States)

A hard x-ray micro-nanoprobe has commenced operation at the Australian Synchrotron providing versatile x-ray fluorescence microscopy across an incident energy range from 4 to 25 keV. Two x-ray probes are used to collect {mu}-XRF and {mu}-XANES for elemental and chemical microanalysis: a Kirkpatrick-Baez mirror microprobe for micron resolution studies and a Fresnel zone plate nanoprobe capable of 60-nm resolution. Some unique aspects of the beamline design and operation are discussed. An advanced energy dispersive x-ray fluorescence detection scheme named Maia has been developed for the beamline, which enables ultrafast x-ray fluorescence microscopy.

OSTI ID:
21608286
Journal Information:
AIP Conference Proceedings, Vol. 1365, Issue 1; Conference: 10. international conference on X-ray microscopy, Chicago, IL (United States), 15-20 Aug 2010; Other Information: DOI: 10.1063/1.3625343; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English