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Title: Growth And Characterization of ZnO/Fe{sub 3}O{sub 4} Bilayer Structure on c-Al{sub 2}O{sub 3} Substrate

Abstract

In the present work, we report on the interfacial characterization of pulsed laser deposited epitaxial bilayer structures of ZnO/Fe{sub 3}O{sub 4} on single crystal alumina (0001) substrates using x-ray photoelectron spectroscopy. X-ray diffraction (XRD) study revealed (111) oriented growth of Fe{sub 3}O{sub 4} and (0001) oriented growth of ZnO in this bilayer structure. Phi-scan shows the epitaxial nature of individual layers. Depth resolved X-ray photoelectron spectroscopy measurements confirm the formation of Fe{sub 2}O{sub 3} at the interface. Observed magnetization measurements are in correlation with the structural results.

Authors:
; ; ;  [1]
  1. UGC-DAE Consortium for Scientific Research, University Campus, Indore (M.P.) 452017 (India)
Publication Date:
OSTI Identifier:
21608191
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1349; Journal Issue: 1; Conference: 55. DAE solid state physics symposium 2010, Manipal (India), 26-30 Dec 2010; Other Information: DOI: 10.1063/1.3606074; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ALUMINIUM OXIDES; CORRELATIONS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; ENERGY BEAM DEPOSITION; EPITAXY; INTERFACES; IRON OXIDES; LASER RADIATION; LAYERS; MAGNETIZATION; MONOCRYSTALS; PULSED IRRADIATION; SUBSTRATES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDES; ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTALS; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; IRON COMPOUNDS; IRRADIATION; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; SCATTERING; SPECTROSCOPY; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS; ZINC COMPOUNDS

Citation Formats

Phase, D. M., Master, Ridhi, Wadikar, A. D., and Choudhary, R. J. Growth And Characterization of ZnO/Fe{sub 3}O{sub 4} Bilayer Structure on c-Al{sub 2}O{sub 3} Substrate. United States: N. p., 2011. Web. doi:10.1063/1.3606074.
Phase, D. M., Master, Ridhi, Wadikar, A. D., & Choudhary, R. J. Growth And Characterization of ZnO/Fe{sub 3}O{sub 4} Bilayer Structure on c-Al{sub 2}O{sub 3} Substrate. United States. doi:10.1063/1.3606074.
Phase, D. M., Master, Ridhi, Wadikar, A. D., and Choudhary, R. J. Fri . "Growth And Characterization of ZnO/Fe{sub 3}O{sub 4} Bilayer Structure on c-Al{sub 2}O{sub 3} Substrate". United States. doi:10.1063/1.3606074.
@article{osti_21608191,
title = {Growth And Characterization of ZnO/Fe{sub 3}O{sub 4} Bilayer Structure on c-Al{sub 2}O{sub 3} Substrate},
author = {Phase, D. M. and Master, Ridhi and Wadikar, A. D. and Choudhary, R. J.},
abstractNote = {In the present work, we report on the interfacial characterization of pulsed laser deposited epitaxial bilayer structures of ZnO/Fe{sub 3}O{sub 4} on single crystal alumina (0001) substrates using x-ray photoelectron spectroscopy. X-ray diffraction (XRD) study revealed (111) oriented growth of Fe{sub 3}O{sub 4} and (0001) oriented growth of ZnO in this bilayer structure. Phi-scan shows the epitaxial nature of individual layers. Depth resolved X-ray photoelectron spectroscopy measurements confirm the formation of Fe{sub 2}O{sub 3} at the interface. Observed magnetization measurements are in correlation with the structural results.},
doi = {10.1063/1.3606074},
journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1349,
place = {United States},
year = {2011},
month = {7}
}