Electronic Structure Studies of 200 MeV Ag{sup +15} Swift Heavy Ion Irradiated SnO{sub 2} Thin Films Using X-Ray Absorption Spectroscopy

Journal Article · Fri Jul 15 00:00:00 EDT 2011 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3606007· OSTI ID:21608178

Thakur, Hardeep; Sharma, Kuldeep Kumar ^[1]; Kumar, Ravi ^[2]; Thakur, Pardeep ^[3]

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1. Department of Physics, National Institute of Technology, Hamirpur (H.P.)-177 005 (India)
2. Center for Material Science and Engineering, National Institute of Technology, Hamirpur (H.P.)-177 005 (India)
3. European Synchrotron Radiation Facility, BP 220, 38043 Grenoble Cedex (France)

Tin dioxide (SnO{sub 2}) thin films were deposited on a well cleaned sapphire single crystal substrate by rf magnetron sputtering technique. After deposition, films were irradiated by swift heavy ion (SHI) irradiation at various ion fluences. We present the X-ray absorption spectra (XAS) at the oxygen K- and Sn M{sub 5,4,} edge. The XAS pattern reveals the broadening of O K- and Sn M{sub 5,4,} edge features with increasing ion fluence. The fraction of under-coordinated surface atoms in the SnO{sub 2} thin films increases, which is attributed to the structural distortions induced by SHI irradiations.

• OSTI ID: 21608178
• Journal Information: AIP Conference Proceedings, Vol. 1349, Issue 1; Conference: 55. DAE solid state physics symposium 2010, Manipal (India), 26-30 Dec 2010; Other Information: DOI: 10.1063/1.3606007; (c) 2011 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
36 MATERIALS SCIENCE
ABSORPTION SPECTROSCOPY
DEPOSITION
ELECTRONIC STRUCTURE
FLUORESCENCE
ION BEAMS
IRRADIATION
MEV RANGE
MONOCRYSTALS
PHYSICAL RADIATION EFFECTS
SAPPHIRE
SILVER IONS
SPUTTERING
SUBSTRATES
THIN FILMS
TIN OXIDES
X-RAY SPECTRA
X-RAY SPECTROSCOPY
BEAMS
CHALCOGENIDES
CHARGED PARTICLES
CORUNDUM
CRYSTALS
EMISSION
ENERGY RANGE
FILMS
IONS
LUMINESCENCE
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHOTON EMISSION
RADIATION EFFECTS
SPECTRA
SPECTROSCOPY
TIN COMPOUNDS