On the use of peak-force tapping atomic force microscopy for quantification of the local elastic modulus in hardened cement paste

Journal Article · Sun Jan 15 00:00:00 EST 2012 · Cement and Concrete Research

DOI:https://doi.org/10.1016/j.cemconres.2011.08.009· OSTI ID:21596952

Trtik, Pavel ^[1]; Kaufmann, Josef ^[1]; Volz, Udo ^[2]

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1. Empa, Swiss Federal Laboratories for Materials Science and Technology, Duebendorf (Switzerland)
2. Bruker Nano GmbH, Mannheim (Germany)

A surface of epoxy-impregnated hardened cement paste was investigated using a novel atomic force microscopy (AFM) imaging mode that allows for the quantitative mapping of the local elastic modulus. The analyzed surface was previously prepared using focussed ion beam milling. The same surface was also characterized by electron microscopy and energy-dispersive X-ray spectroscopy. We demonstrate the capability of this quantitative nanomechanical mapping to provide information on the local distribution of the elastic modulus (from about 1 to about 100 GPa) with a spatial resolution in the range of decananometers, that corresponds to that of low-keV back-scattered electron imaging. Despite some surface roughness which affects the measured nanomechanical properties it is shown that topography, adhesion and Young's modulus can be clearly distinguished. The quantitative mapping of the local elastic modulus is able to discriminate between phases in the cement paste microstructure that cannot be distinguished from the corresponding back-scattered electron images.

• OSTI ID: 21596952
• Journal Information: Cement and Concrete Research, Vol. 42, Issue 1; Other Information: DOI: 10.1016/j.cemconres.2011.08.009; PII: S0008-8846(11)00231-6; Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0008-8846
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ATOMIC FORCE MICROSCOPY
CEMENTS
ELECTRON MICROSCOPY
ELECTRONS
EPOXIDES
IMAGE PROCESSING
ION BEAMS
KEV RANGE
MAPPING
MEV RANGE
MICROSTRUCTURE
PRESSURE RANGE GIGA PA
SPATIAL RESOLUTION
SURFACES
TOPOGRAPHY
X-RAY SPECTROSCOPY
YOUNG MODULUS
BEAMS
BUILDING MATERIALS
ELEMENTARY PARTICLES
ENERGY RANGE
FERMIONS
LEPTONS
MATERIALS
MECHANICAL PROPERTIES
MICROSCOPY
ORGANIC COMPOUNDS
ORGANIC OXYGEN COMPOUNDS
PRESSURE RANGE
PROCESSING
RESOLUTION
SPECTROSCOPY