Direct tunneling of electrons in Al-n{sup +}-Si-SiO{sub 2}-n-Si structures under conditions of nonstationary depletion of the semiconductor surface of the majority charge carriers
Specific features of direct tunneling of electrons through an ultrathin ({approx}40 A) oxide in metal-SiO{sub 2}-Si structures under nonstationary conditions of depletion of the semiconductor surface, in which case the potential relief in the insulator is only slightly perturbed by external electric fields, have been experimentally studied. Penetrability of the tunneling barrier is appreciably limited by a classically forbidden region in n-Si (this region is brought about by fixed negative charge in SiO{sub 2}). As the voltage drop across oxide is increased, the electrons localized within this oxide transfer to the semiconductor, which is accompanied by a drastic increase in the tunneling current. The values of coefficients linear rise in the logarithm of tunneling current as the voltage at the isolator is increased are determined from the experiment. These values are not consistent with the data calculated on the basis of a model of a rectangular barrier with parameters typical of 'thick' oxides. It is shown that actual values of the effective mass are bound to be larger than 0.5m{sub 0}, while the height of the barrier is bound to be lower than 3.1 eV.
- OSTI ID:
- 21562244
- Journal Information:
- Semiconductors, Vol. 44, Issue 8; Other Information: DOI: 10.1134/S1063782610080105; Copyright (c) 2010 Pleiades Publishing, Ltd.; ISSN 1063-7826
- Country of Publication:
- United States
- Language:
- English
Similar Records
Resonant tunneling with high peak to valley current ratio in SiO{sub 2}/nc-Si/SiO{sub 2} multi-layers at room temperature
Reconstruction of dependences of the tunneling current on the oxide voltage using the dynamic current-voltage characteristics of the n{sup +}-Si-SiO{sub 2}-n-Si heterostructures
Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHARGE CARRIERS
EFFECTIVE MASS
ELECTRIC FIELDS
ELECTRIC POTENTIAL
ELECTRONS
POTENTIALS
SEMICONDUCTOR MATERIALS
SILICA
SILICON OXIDES
SURFACES
TUNNEL EFFECT
VOLTAGE DROP
CHALCOGENIDES
ELEMENTARY PARTICLES
FERMIONS
LEPTONS
MASS
MATERIALS
MINERALS
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
SILICON COMPOUNDS