Semianalytic model of electron pulse propagation: Magnetic lenses and rf pulse compression cavities
Journal Article
·
· Journal of Applied Physics
- Department of Physics, University of Illinois at Chicago, 845 W. Taylor (M/C 273), Chicago, Illinois 60607 (United States)
The analytical Gaussian electron pulse propagation model of Michalik and Sipe [J. Appl. Phys. 99, 054908 (2006)] is extended to include the action of external forces on the pulse. The resultant ability to simulate efficiently the effect of electron optical elements (e.g., magnetic lenses and radio-frequency cavities) allows for the rapid assessment of electron pulse delivery systems in time-resolved ultrafast electron diffraction and microscopy experiments.
- OSTI ID:
- 21537998
- Journal Information:
- Journal of Applied Physics, Vol. 108, Issue 12; Other Information: DOI: 10.1063/1.3512847; (c) 2010 American Institute of Physics; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CHARGES
COMPRESSION
DELIVERY
ELECTROMAGNETIC LENSES
ELECTRON BEAMS
ELECTRON DIFFRACTION
ELECTRON MICROSCOPY
ELECTRONS
LENSES
OPTICS
PULSES
RADIOWAVE RADIATION
SIMULATION
TIME RESOLUTION
BEAMS
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELEMENTARY PARTICLES
FERMIONS
LEPTON BEAMS
LEPTONS
MICROSCOPY
PARTICLE BEAMS
RADIATIONS
RESOLUTION
SCATTERING
TIMING PROPERTIES
GENERAL PHYSICS
CHARGES
COMPRESSION
DELIVERY
ELECTROMAGNETIC LENSES
ELECTRON BEAMS
ELECTRON DIFFRACTION
ELECTRON MICROSCOPY
ELECTRONS
LENSES
OPTICS
PULSES
RADIOWAVE RADIATION
SIMULATION
TIME RESOLUTION
BEAMS
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELEMENTARY PARTICLES
FERMIONS
LEPTON BEAMS
LEPTONS
MICROSCOPY
PARTICLE BEAMS
RADIATIONS
RESOLUTION
SCATTERING
TIMING PROPERTIES