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Title: Interface engineering of high-Mg-content MgZnO/BeO/Si for p-n heterojunction solar-blind ultraviolet photodetectors

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.3595342· OSTI ID:21518465
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  1. Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190 (China)

High-quality wurtzite MgZnO film was deposited on Si(111) substrate via a delicate interface engineering using BeO, by which solar-blind ultraviolet photodetectors were fabricated on the n-MgZnO(0001)/p-Si(111) heterojunction. A thin Be layer was deposited on clean Si surface with subsequent in situ oxidation processes, which provides an excellent template for high-Mg-content MgZnO growth. The interface controlling significantly improves the device performance, as the photodetector demonstrates a sharp cutoff wavelength at 280 nm, consistent with the optical band gap of the epilayer. Our experimental results promise potential applications of this technique in integration of solar-blind ultraviolet optoelectronic device with Si microelectronic technologies.

OSTI ID:
21518465
Journal Information:
Applied Physics Letters, Vol. 98, Issue 22; Other Information: DOI: 10.1063/1.3595342; (c) 2011 American Institute of Physics; ISSN 0003-6951
Country of Publication:
United States
Language:
English