Growth and magnetic property of {zeta}-phase Mn{sub 2}N{sub 1{+-}x} thin films by plasma-assisted molecular beam epitaxy
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Physics and Engineering, Sun Yat-sen University, Guangzhou 510275 (China)
- School of Science, Guilin University of Technology, Guilin 541004 (China)
{zeta}-phase manganese nitride films were directly grown on sapphire substrates using plasma-assisted molecular beam epitaxy. Mn{sub 2}N{sub 1.06}, Mn{sub 2}N{sub 0.98}, and Mn{sub 2}N{sub 0.86} films were synthesized by controlling the temperature of the effusion cell filled with highly pure manganese powder. The composition, structure, and morphology of the films were identified by x-ray photoelectron spectroscopy, x-ray diffraction and atomic force microscopy, and the magnetic properties of the films were characterized by a superconducting quantum interference device magnetometer at 5 and 300 K. The magnetic measurements reveal that Mn{sub 2}N{sub 1{+-}x} exhibits weak ferromagnetism at 5 K, which is mainly ascribed to the weak interaction among the Mn cations induced by the nitrogen vacancies. Furthermore, the Mn{sub 2}N{sub 0.86} single-crystalline films are found to have room-temperature ferromagnetism, which is attributed to the strain of the Mn{sub 2}N{sub 0.86} films raised from lattice mismatch between the Mn{sub 2}N{sub 0.86} films and the substrates.
- OSTI ID:
- 21476258
- Journal Information:
- Journal of Applied Physics, Vol. 107, Issue 10; Other Information: DOI: 10.1063/1.3386516; (c) 2010 American Institute of Physics; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ATOMIC FORCE MICROSCOPY
CRYSTAL GROWTH
DEPOSITION
DIFFUSION
FERROMAGNETIC MATERIALS
FERROMAGNETISM
MAGNETIC PROPERTIES
MANGANESE NITRIDES
MOLECULAR BEAM EPITAXY
MONOCRYSTALS
PLASMA
SEMICONDUCTOR MATERIALS
SQUID DEVICES
SUBSTRATES
TEMPERATURE DEPENDENCE
THIN FILMS
VACANCIES
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY
COHERENT SCATTERING
CRYSTAL DEFECTS
CRYSTAL GROWTH METHODS
CRYSTAL STRUCTURE
CRYSTALS
DIFFRACTION
ELECTRON SPECTROSCOPY
ELECTRONIC EQUIPMENT
EPITAXY
EQUIPMENT
FILMS
FLUXMETERS
MAGNETIC MATERIALS
MAGNETISM
MANGANESE COMPOUNDS
MATERIALS
MEASURING INSTRUMENTS
MICROSCOPY
MICROWAVE EQUIPMENT
NITRIDES
NITROGEN COMPOUNDS
PHOTOELECTRON SPECTROSCOPY
PHYSICAL PROPERTIES
PNICTIDES
POINT DEFECTS
SCATTERING
SPECTROSCOPY
SUPERCONDUCTING DEVICES
TRANSITION ELEMENT COMPOUNDS