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Title: Investigation of the internal electric field in cadmium zinc telluride detectors using the Pockels effect and the analysis of charge transients

Abstract

The Pockels electro-optic effect can be used to investigate the internal electric field in cadmium zinc telluride (CZT) single crystals that are used to fabricate room temperature x and gamma radiation detectors. An agreement is found between the electric field mapping obtained from Pockels effect images and the measurements of charge transients generated by alpha particles. The Pockels effect images of a CZT detector along two mutually perpendicular directions are used to optimize the detector response in a dual anode configuration, a device in which the symmetry of the internal electric field with respect to the anode strips is of critical importance. The Pockels effect is also used to map the electric field in a CZT detector with dual anodes and an attempt is made to find a correlation with the simulated electric potential in such detectors. Finally, the stress-induced birefringence effects seen in the Pockels images are presented and discussed.

Authors:
; ; ; ; ;  [1]; ; ; ; ; ;  [2]
  1. Department of Physics, Fisk University, 1000 17th Ave., Nashville, Tennessee 37208 (United States)
  2. Department of Physics and Astronomy, Washington University in St. Louis, 1 Brookings Dr., CB 1105, St. Louis, Missouri 61130 (United States)
Publication Date:
OSTI Identifier:
21476110
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 107; Journal Issue: 2; Other Information: DOI: 10.1063/1.3272882; (c) 2010 American Institute of Physics; Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 36 MATERIALS SCIENCE; ALPHA DETECTION; BIREFRINGENCE; CADMIUM COMPOUNDS; CORRELATIONS; ELECTRIC FIELDS; ELECTRO-OPTICAL EFFECTS; GAMMA DETECTION; IMAGES; MONOCRYSTALS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS; TEMPERATURE RANGE 0273-0400 K; TRANSIENTS; X-RAY DETECTION; ZINC COMPOUNDS; CHARGED PARTICLE DETECTION; CRYSTALS; DETECTION; MATERIALS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; REFRACTION; TEMPERATURE RANGE

Citation Formats

Groza, Michael, Cui Yunlong, Buliga, Vladimir, Guo, Mingsheng, Coca, Constantine, Burger, Arnold, Krawczynski, Henric, Garson, Alfred III, Martin, Jerrad W., Lee, Kuen, Li Qiang, and Beilicke, Matthias. Investigation of the internal electric field in cadmium zinc telluride detectors using the Pockels effect and the analysis of charge transients. United States: N. p., 2010. Web. doi:10.1063/1.3272882.
Groza, Michael, Cui Yunlong, Buliga, Vladimir, Guo, Mingsheng, Coca, Constantine, Burger, Arnold, Krawczynski, Henric, Garson, Alfred III, Martin, Jerrad W., Lee, Kuen, Li Qiang, & Beilicke, Matthias. Investigation of the internal electric field in cadmium zinc telluride detectors using the Pockels effect and the analysis of charge transients. United States. doi:10.1063/1.3272882.
Groza, Michael, Cui Yunlong, Buliga, Vladimir, Guo, Mingsheng, Coca, Constantine, Burger, Arnold, Krawczynski, Henric, Garson, Alfred III, Martin, Jerrad W., Lee, Kuen, Li Qiang, and Beilicke, Matthias. Fri . "Investigation of the internal electric field in cadmium zinc telluride detectors using the Pockels effect and the analysis of charge transients". United States. doi:10.1063/1.3272882.
@article{osti_21476110,
title = {Investigation of the internal electric field in cadmium zinc telluride detectors using the Pockels effect and the analysis of charge transients},
author = {Groza, Michael and Cui Yunlong and Buliga, Vladimir and Guo, Mingsheng and Coca, Constantine and Burger, Arnold and Krawczynski, Henric and Garson, Alfred III and Martin, Jerrad W. and Lee, Kuen and Li Qiang and Beilicke, Matthias},
abstractNote = {The Pockels electro-optic effect can be used to investigate the internal electric field in cadmium zinc telluride (CZT) single crystals that are used to fabricate room temperature x and gamma radiation detectors. An agreement is found between the electric field mapping obtained from Pockels effect images and the measurements of charge transients generated by alpha particles. The Pockels effect images of a CZT detector along two mutually perpendicular directions are used to optimize the detector response in a dual anode configuration, a device in which the symmetry of the internal electric field with respect to the anode strips is of critical importance. The Pockels effect is also used to map the electric field in a CZT detector with dual anodes and an attempt is made to find a correlation with the simulated electric potential in such detectors. Finally, the stress-induced birefringence effects seen in the Pockels images are presented and discussed.},
doi = {10.1063/1.3272882},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 2,
volume = 107,
place = {United States},
year = {2010},
month = {1}
}