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Title: Pulsed generation in a combined-diode-pumped Nd{sup 3+}:Ca{sub 3}Ga{sub 2}Ge{sub 3}O{sub 12} laser with a small jitter of the pulse repetition rate

Abstract

Pulsed generation in a solid-state Nd{sup 3+}:Ca{sub 3}Ga{sub 2}Ge{sub 3}O{sub 12} (Nd:CGGG) laser (SSL) with passive Q-switching by the Cr{sup 4+}:YAG crystal is studied. To reduce the pulse repetition rate jitter of the SSL generation, the current through a pump diode was combined from a constant component and short pulse. It is shown that if the sum of the constant and pulsed components of the optical pump power exceeds the threshold pump power by less than twice (1 < x{sub p} < 2), the pulse repetition rate jitter of the SSL generation has the local minimum, which is obtained when the constant component of the pump power relative to the threshold power is 2-x{sub p}. The natural lifetime {tau} of the upper level of the laser element (LE) in the SSL cavity is proposed to be measured by the delay of the SSL pulse with respect to the leading edge of the pump pulse. It is shown that the lifetime measured in this way is shorter than the time {tau} measured by the standard method in which the LE resides outside the SSL. At the laser pulse repetition rate of 192 Hz, the pulse energy of 3.5 {mu}J and durationmore » of 11 ns, the relative jitter of the laser pulse period was {approx}0.06 %, which is by more than two orders of magnitude lower than that under a constant current through the pump diode. (lasers)« less

Authors:
;  [1]
  1. Fiber Optics Research Center, Russian Academy of Sciences, Moscow (Russian Federation)
Publication Date:
OSTI Identifier:
21470151
Resource Type:
Journal Article
Journal Name:
Quantum Electronics (Woodbury, N.Y.)
Additional Journal Information:
Journal Volume: 39; Journal Issue: 1; Other Information: DOI: 10.1070/QE2009v039n01ABEH013922; Journal ID: ISSN 1063-7818
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CHROMIUM IONS; CRYSTALS; DIODE-PUMPED SOLID STATE LASERS; LASER CAVITIES; NEODYMIUM IONS; NEODYMIUM LASERS; PULSES; Q-SWITCHING; CHARGED PARTICLES; IONS; LASERS; SOLID STATE LASERS

Citation Formats

Belovolov, M I, and Shatalov, A F. Pulsed generation in a combined-diode-pumped Nd{sup 3+}:Ca{sub 3}Ga{sub 2}Ge{sub 3}O{sub 12} laser with a small jitter of the pulse repetition rate. United States: N. p., 2009. Web. doi:10.1070/QE2009V039N01ABEH013922.
Belovolov, M I, & Shatalov, A F. Pulsed generation in a combined-diode-pumped Nd{sup 3+}:Ca{sub 3}Ga{sub 2}Ge{sub 3}O{sub 12} laser with a small jitter of the pulse repetition rate. United States. https://doi.org/10.1070/QE2009V039N01ABEH013922
Belovolov, M I, and Shatalov, A F. 2009. "Pulsed generation in a combined-diode-pumped Nd{sup 3+}:Ca{sub 3}Ga{sub 2}Ge{sub 3}O{sub 12} laser with a small jitter of the pulse repetition rate". United States. https://doi.org/10.1070/QE2009V039N01ABEH013922.
@article{osti_21470151,
title = {Pulsed generation in a combined-diode-pumped Nd{sup 3+}:Ca{sub 3}Ga{sub 2}Ge{sub 3}O{sub 12} laser with a small jitter of the pulse repetition rate},
author = {Belovolov, M I and Shatalov, A F},
abstractNote = {Pulsed generation in a solid-state Nd{sup 3+}:Ca{sub 3}Ga{sub 2}Ge{sub 3}O{sub 12} (Nd:CGGG) laser (SSL) with passive Q-switching by the Cr{sup 4+}:YAG crystal is studied. To reduce the pulse repetition rate jitter of the SSL generation, the current through a pump diode was combined from a constant component and short pulse. It is shown that if the sum of the constant and pulsed components of the optical pump power exceeds the threshold pump power by less than twice (1 < x{sub p} < 2), the pulse repetition rate jitter of the SSL generation has the local minimum, which is obtained when the constant component of the pump power relative to the threshold power is 2-x{sub p}. The natural lifetime {tau} of the upper level of the laser element (LE) in the SSL cavity is proposed to be measured by the delay of the SSL pulse with respect to the leading edge of the pump pulse. It is shown that the lifetime measured in this way is shorter than the time {tau} measured by the standard method in which the LE resides outside the SSL. At the laser pulse repetition rate of 192 Hz, the pulse energy of 3.5 {mu}J and duration of 11 ns, the relative jitter of the laser pulse period was {approx}0.06 %, which is by more than two orders of magnitude lower than that under a constant current through the pump diode. (lasers)},
doi = {10.1070/QE2009V039N01ABEH013922},
url = {https://www.osti.gov/biblio/21470151}, journal = {Quantum Electronics (Woodbury, N.Y.)},
issn = {1063-7818},
number = 1,
volume = 39,
place = {United States},
year = {Sat Jan 31 00:00:00 EST 2009},
month = {Sat Jan 31 00:00:00 EST 2009}
}