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Title: Scanning near-field optical microscopy and near-field optical probes: properties, fabrication, and control of parameters

Abstract

A brief review of modern applications of scanning near-field optical (SNO) devices in microscopy, spectroscopy, and lithography is presented in the introduction. The problem of the development of SNO probes, as the most important elements of SNO devices determining their resolution and efficiency, is discussed. Based on the works of the authors, two different methods for fabricating SNO probes by using the adiabatic tapering of an optical fibre are considered: the laser-heated mechanical drawing and chemical etching. A nondestructive optical method for controlling the nanometre aperture of SNO probes is proposed, substantiated, and tested experimentally. The method is based on the reconstruction of a near-field source with the help of a theoretical algorithm of the inverse problem from the experimental far-filed intensity distribution. Some prospects for a further refinement of the construction and technology of SNO probes are discussed. (optical microscopy)

Authors:
; ;  [1]
  1. Saint-Petersburg State University of Information Technologies, Mechanics and Optics (Russian Federation)
Publication Date:
OSTI Identifier:
21466613
Resource Type:
Journal Article
Resource Relation:
Journal Name: Quantum Electronics (Woodbury, N.Y.); Journal Volume: 37; Journal Issue: 2; Other Information: DOI: 10.1070/QE2007v037n02ABEH008955
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ALGORITHMS; EFFICIENCY; ETCHING; LASER-RADIATION HEATING; OPTICAL EQUIPMENT; OPTICAL FIBERS; OPTICAL MICROSCOPY; PROBES; RESOLUTION; SPECTROSCOPY; EQUIPMENT; FIBERS; HEATING; MATHEMATICAL LOGIC; MICROSCOPY; PLASMA HEATING; SURFACE FINISHING

Citation Formats

Dryakhlushin, V F, Veiko, V P, and Voznesenskii, N B. Scanning near-field optical microscopy and near-field optical probes: properties, fabrication, and control of parameters. United States: N. p., 2007. Web. doi:10.1070/QE2007V037N02ABEH008955.
Dryakhlushin, V F, Veiko, V P, & Voznesenskii, N B. Scanning near-field optical microscopy and near-field optical probes: properties, fabrication, and control of parameters. United States. doi:10.1070/QE2007V037N02ABEH008955.
Dryakhlushin, V F, Veiko, V P, and Voznesenskii, N B. Wed . "Scanning near-field optical microscopy and near-field optical probes: properties, fabrication, and control of parameters". United States. doi:10.1070/QE2007V037N02ABEH008955.
@article{osti_21466613,
title = {Scanning near-field optical microscopy and near-field optical probes: properties, fabrication, and control of parameters},
author = {Dryakhlushin, V F and Veiko, V P and Voznesenskii, N B},
abstractNote = {A brief review of modern applications of scanning near-field optical (SNO) devices in microscopy, spectroscopy, and lithography is presented in the introduction. The problem of the development of SNO probes, as the most important elements of SNO devices determining their resolution and efficiency, is discussed. Based on the works of the authors, two different methods for fabricating SNO probes by using the adiabatic tapering of an optical fibre are considered: the laser-heated mechanical drawing and chemical etching. A nondestructive optical method for controlling the nanometre aperture of SNO probes is proposed, substantiated, and tested experimentally. The method is based on the reconstruction of a near-field source with the help of a theoretical algorithm of the inverse problem from the experimental far-filed intensity distribution. Some prospects for a further refinement of the construction and technology of SNO probes are discussed. (optical microscopy)},
doi = {10.1070/QE2007V037N02ABEH008955},
journal = {Quantum Electronics (Woodbury, N.Y.)},
number = 2,
volume = 37,
place = {United States},
year = {Wed Feb 28 00:00:00 EST 2007},
month = {Wed Feb 28 00:00:00 EST 2007}
}
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