In-situ lattice-strain analysis of a ferroelectric thin film under an applied pulse electric field

Journal Article · Wed Jun 23 00:00:00 EDT 2010 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3463162· OSTI ID:21431063

Sakata, O ^[1]; Yasui, S; Yamada, T; Funakubo, H ^[2]; Yabashi, M ^[3]; Kimura, S ^[1]

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1. Japan Synchrotron Radiation Research Institute / SPring-8, Kouto, Sayo, Sayo, Hyogo 679-5198 (Japan)
2. Tokyo Institute of Technology, 4259-J2-43, Nagatsuta, Midori, Yokohama 226-8502 (Japan)
3. XFEL Project Head Office, RIKEN / SPring-8, Kouto, Sayo, Sayo, Hyogo 679-5148 (Japan)

We developed an in-situ measurement system for characterizing the relationship between ferroelectricity and lattice distortion of a ferroelectric thin film at BL13XU, SPring-8. The dielectric polarization obtained and the lattice strain evaluated provide us with the electrostrictive coefficient of the film. The system for the method consists of a refractive lens for two dimensional micron focusing, ferroelectric characterization system, high-precision four-circle diffractometer, and time-resolved photon counting system. It enables in-situ measurements of the electric polarization of the film and an electric-field-induced strain using nano-second order time-resolved synchrotron diffraction. We applied the method to determining the lattice constant distorted by the electric field and the polarization value of a 410 nm-thick BiFeO{sub 3} thin film. The piezoelectric constant d{sub 33} evaluated was about 28 pm/V. The polarization observed allowed us to evaluate an electrostrictive coefficient Q of 1{center_dot}4x10{sup -2} m{sup 4}/C{sup 2}.

• OSTI ID: 21431063
• Journal Information: AIP Conference Proceedings, Vol. 1234, Issue 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463162; (c) 2010 American Institute of Physics; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ACCURACY
BISMUTH COMPOUNDS
DIFFRACTION
DIFFRACTOMETERS
ELECTRIC FIELDS
FERRITES
FERROELECTRIC MATERIALS
LATTICE PARAMETERS
PHOTONS
PIEZOELECTRICITY
POLARIZATION
PULSES
SPRING-8 STORAGE RING
STRAINS
SYNCHROTRONS
THIN FILMS
TIME RESOLUTION
TWO-DIMENSIONAL CALCULATIONS
ACCELERATORS
BOSONS
COHERENT SCATTERING
CYCLIC ACCELERATORS
DIELECTRIC MATERIALS
ELECTRICITY
ELEMENTARY PARTICLES
FERRIMAGNETIC MATERIALS
FILMS
IRON COMPOUNDS
MAGNETIC MATERIALS
MASSLESS PARTICLES
MATERIALS
MEASURING INSTRUMENTS
OXYGEN COMPOUNDS
RADIATION SOURCES
RESOLUTION
SCATTERING
STORAGE RINGS
SYNCHROTRON RADIATION SOURCES
TIMING PROPERTIES
TRANSITION ELEMENT COMPOUNDS