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Title: Acceptor Type Vacancy Complexes In As-Grown ZnO

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.3518301· OSTI ID:21428735
;  [1];  [2]
  1. Department of Applied Physics, Aalto University, P.O. Box 11100, Fin-00076 Aalto, Espoo (Finland)
  2. Centre de Recherche sur l'Hetero-Epitaxie et ses Applications, Centre National de la Recherche Scientifique, CRHEA-CNRS, Rue Bernard Gregory, Sophia Antipolis, 06560 Valbonne (France)

One of the many technological areas that ZnO is interesting for is the construction of opto-electronic devices working in the blue-UV range as its large band gap ({approx}3.4 eV at 10 K) makes them suitable for that purpose. As-grown ZnO shows generally n-type conductivity partially due to the large concentration of unintentional shallow donors, like H, but impurities can also form complexes with acceptor type defects (Zn vacancy) leading to the creation of compensating defects. Recently, Li{sub Zn} and Na{sub Zn} acceptors have been measured and H could form similar type of defects. Doppler Broadening Positron Annihilation spectroscopy experimental results on the observation of Zn related vacancy complexes in ZnO thin films, as-grown, O implanted and Al doped will be presented. Results show that as-grown ZnO film show small Zn vacancy related complexed that could be related to presence of H as a unintentional doping element.

OSTI ID:
21428735
Journal Information:
AIP Conference Proceedings, Vol. 1292, Issue 1; Conference: E-MRS Symposium F: 2010 wide bandgap cubic semiconductors - From growth to devices, Strasbourg (France), 8-10 Oct 2010; Other Information: DOI: 10.1063/1.3518301; (c) 2010 American Institute of Physics; ISSN 0094-243X
Country of Publication:
United States
Language:
English