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Title: Performance Optimization for Hard X-ray Microscopy Beamlines Guided by Partially-Coherent Wavefront Propagation Calculations

Abstract

Hard x-ray range synchrotron radiation still remains only partially coherent even for ultra-low emittance third-generation sources, such as NSLS-II. On the other hand, many of the scientific goals targeted by new advanced hard x-ray microscopy beamlines--e.g. development of scanning microscopy with nanometer-scale spatial resolution or coherent diffraction imaging microscopy--require high degree of transverse coherence and high radiation flux at a sample. Detailed quantitative prediction of partially-coherent x-ray beam properties at propagation from an undulator, along a beamline with a number of optical elements, can only be obtained from accurate physical-optics based numerical simulations. We present an example of such simulations performed for the NSLS-II Hard x-ray Nanoprobe beamline using ''Synchrotron Radiation Workshop''(SRW) computer code. In addition to tracking of intensity distributions at different locations of the beamline, we include numerical experiments with a two-slit interference scheme into our analysis, in order to characterize transverse coherence of the resulting wavefront. The wavefront propagation method which has been used offers high flexibility in the beamline optimization, allowing to choose optical element parameters for different types of microscopy experiments.

Authors:
; ; ;  [1]
  1. NSLS-II, Brookhaven National Laboratory, Upton NY 11973 (United States)
Publication Date:
OSTI Identifier:
21410331
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1234; Journal Issue: 1; Conference: SRI 2009: 10. international conference on radiation instrumentation, Melbourne (Australia), 27 Sep - 2 Oct 2009; Other Information: DOI: 10.1063/1.3463322; (c) 2010 American Institute of Physics; Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; BEAMS; COMPUTERIZED SIMULATION; DIFFRACTION; FLEXIBILITY; FORECASTING; HARD X RADIATION; INTERFERENCE; MICROSCOPY; NSLS; OPTIMIZATION; RADIATION FLUX; SPATIAL RESOLUTION; SYNCHROTRON RADIATION; WAVE PROPAGATION; WIGGLER MAGNETS; BREMSSTRAHLUNG; COHERENT SCATTERING; ELECTROMAGNETIC RADIATION; EQUIPMENT; IONIZING RADIATIONS; MAGNETS; MECHANICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; RESOLUTION; SCATTERING; SIMULATION; SYNCHROTRON RADIATION SOURCES; TENSILE PROPERTIES; X RADIATION

Citation Formats

Chubar, Oleg, Chu, Yong S, Kaznatcheev, Konstantine, and Yan, Hanfei. Performance Optimization for Hard X-ray Microscopy Beamlines Guided by Partially-Coherent Wavefront Propagation Calculations. United States: N. p., 2010. Web. doi:10.1063/1.3463322.
Chubar, Oleg, Chu, Yong S, Kaznatcheev, Konstantine, & Yan, Hanfei. Performance Optimization for Hard X-ray Microscopy Beamlines Guided by Partially-Coherent Wavefront Propagation Calculations. United States. doi:10.1063/1.3463322.
Chubar, Oleg, Chu, Yong S, Kaznatcheev, Konstantine, and Yan, Hanfei. Wed . "Performance Optimization for Hard X-ray Microscopy Beamlines Guided by Partially-Coherent Wavefront Propagation Calculations". United States. doi:10.1063/1.3463322.
@article{osti_21410331,
title = {Performance Optimization for Hard X-ray Microscopy Beamlines Guided by Partially-Coherent Wavefront Propagation Calculations},
author = {Chubar, Oleg and Chu, Yong S and Kaznatcheev, Konstantine and Yan, Hanfei},
abstractNote = {Hard x-ray range synchrotron radiation still remains only partially coherent even for ultra-low emittance third-generation sources, such as NSLS-II. On the other hand, many of the scientific goals targeted by new advanced hard x-ray microscopy beamlines--e.g. development of scanning microscopy with nanometer-scale spatial resolution or coherent diffraction imaging microscopy--require high degree of transverse coherence and high radiation flux at a sample. Detailed quantitative prediction of partially-coherent x-ray beam properties at propagation from an undulator, along a beamline with a number of optical elements, can only be obtained from accurate physical-optics based numerical simulations. We present an example of such simulations performed for the NSLS-II Hard x-ray Nanoprobe beamline using ''Synchrotron Radiation Workshop''(SRW) computer code. In addition to tracking of intensity distributions at different locations of the beamline, we include numerical experiments with a two-slit interference scheme into our analysis, in order to characterize transverse coherence of the resulting wavefront. The wavefront propagation method which has been used offers high flexibility in the beamline optimization, allowing to choose optical element parameters for different types of microscopy experiments.},
doi = {10.1063/1.3463322},
journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1234,
place = {United States},
year = {2010},
month = {6}
}