The New Maia Detector System: Methods For High Definition Trace Element Imaging Of Natural Material

Journal Article · Tue Apr 06 00:00:00 EDT 2010 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3399266· OSTI ID:21371776

Ryan, C G ^[1]; Siddons, D P; Kuczewski, A ^[2]; Kirkham, R; Dunn, P A; Hough, R M; Lintern, M J; Cleverley, J ^[1]; Moorhead, G ^[1]; De Geronimo, G ^[3]; Paterson, D J; Jonge, M D. de; Howard, D L ^[4]; Kappen, P ^[5]

---

1. CSIRO, Bayview Avenue, Clayton VIC 3168 (Australia)
2. National Synchrotron Light Source, Brookhaven National Laboratory, NY (United States)
3. Instrumentation Division, Brookhaven National Laboratory, Brookhaven NY (United States)
4. Australian Synchrotron, Clayton VIC (Australia)
5. Department of Physics, La Trobe University, VIC (Australia)

Motivated by the need for megapixel high definition trace element imaging to capture intricate detail in natural material, together with faster acquisition and improved counting statistics in elemental imaging, a large energy-dispersive detector array called Maia has been developed by CSIRO and BNL for SXRF imaging on the XFM beamline at the Australian Synchrotron. A 96 detector prototype demonstrated the capacity of the system for real-time deconvolution of complex spectral data using an embedded implementation of the Dynamic Analysis method and acquiring highly detailed images up to 77 M pixels spanning large areas of complex mineral sample sections.

• OSTI ID: 21371776
• Journal Information: AIP Conference Proceedings, Vol. 1221, Issue 1; Conference: 20. international congress on X-ray optics and microanalysis, Karlsruhe (Germany), 15-18 Sep 2009; Other Information: DOI: 10.1063/1.3399266; (c) 2010 American Institute of Physics; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
IMAGES
IMPLEMENTATION
MICROSCOPY
MINERALS
MULTI-ELEMENT ANALYSIS
QUANTITATIVE CHEMICAL ANALYSIS
SEMICONDUCTOR DETECTORS
TRACE AMOUNTS
X-RAY DETECTION
X-RAY FLUORESCENCE ANALYSIS
CHEMICAL ANALYSIS
DETECTION
MEASURING INSTRUMENTS
NONDESTRUCTIVE ANALYSIS
RADIATION DETECTION
RADIATION DETECTORS
X-RAY EMISSION ANALYSIS