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Title: Order-disorder phase transformations in quaternary pyrochlore oxide system: Investigated by X-ray diffraction, transmission electron microscopy and Raman spectroscopic techniques

Journal Article · · Journal of Solid State Chemistry
 [1]; ; ;  [1]
  1. Materials and Minerals Division, National Institute for Interdisciplinary Science and Technology (NIIST), Trivandrum 695 019 (India)

Order-disorder transformations in a quaternary pyrochlore oxide system, Ca-Y-Zr-Ta-O, were studied by powder X-ray diffraction (XRD) method, transmission electron microscope (TEM) and FT-NIR Raman spectroscopic techniques. The solid solutions in different ratios, 4:1, 2:1, 1:1, 1:2, 1:4, 1:6, of CaTaO{sub 3.5} and YZrO{sub 3.5} were prepared by the conventional high temperature ceramic route. The XRD results and Rietveld analysis revealed that the crystal structure changed from an ordered pyrochlore structure to a disordered defect fluorite structure as the ratios of the solid solutions of CaTaO{sub 3.5} and YZrO{sub 3.5} were changed from 4:1 to 1:4. This structural transformation in the present system is attributed to the lowering of the average cation radius ratio, r{sub A}/r{sub B} as a result of progressive and simultaneous substitution of larger cation Ca{sup 2+} for Y{sup 3+} at A sites and smaller cation Ta{sup 5+} for Zr{sup 4+} at B sites. Raman spectroscopy and TEM analysis corroborated the XRD results. - Graphical abstract: Selected area electron diffraction (SAED) patterns showed highly ordered diffraction maxima with characteristic superlattice weak diffraction spots of the pyrochlore structure for (a) Ca{sub 0.6}7Y{sub 1.33}Zr{sub 1.33}Ta{sub 0.33}O{sub 7} (C2YZT2) and bright diffraction maxima arranged in a ring pattern of the fluorite structure for (b) Ca{sub 0.29}7Y{sub 1.71}Zr{sub 1.71}Ta{sub 0.29}O{sub 7} (CY6Z6T).

OSTI ID:
21370557
Journal Information:
Journal of Solid State Chemistry, Vol. 182, Issue 8; Other Information: DOI: 10.1016/j.jssc.2009.06.016; PII: S0022-4596(09)00266-7; Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; ISSN 0022-4596
Country of Publication:
United States
Language:
English