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Title: Ionic diffusion mastering using crystal-chemistry parameters: tau-Cu{sub 1/2}Ag{sub 1/2}V{sub 2}O{sub 5} structure determination and comparison with refined delta-Ag{sub x}V{sub 2}O{sub 5} and epsilon-Cu{sub x}V{sub 2}O{sub 5} ones

Journal Article · · Journal of Solid State Chemistry
 [1]; ;  [1]
  1. Centre d'Elaboration de Materiaux et d'Etudes Structurales-CNRS 29, rue Jeanne Marvig, BP 94347, 31055 Toulouse cedex 4 (France)

tau-Ag{sub 1/2}Cu{sub 1/2}V{sub 2}O{sub 5} compound crystallises in the monoclinic system space group C2/m with cell parameters a=11.757(4) A, b=3.6942(5) A, c=9.463(2) A, and beta=114.62(2){sup o}. The structure is build up with V{sub 4}O{sub 10} D4 double layer. The silver and copper ions are located in two different oxygenated tunnels. Examination of electronic density maps shows that while the silver ions are located in defined crystallographic sites, the copper ones are fully delocalised over the whole tunnel. Comparison with delta-Ag{sub x}V{sub 2}O{sub 5} and epsilon-Cu{sub x}V{sub 2}O{sub 5} refined structure allows to define crystal chemistry parameters governing the ionic delocalisation and give clues to predict from structural consideration the expected electrical behaviour with the aim to make possible a structural design to enhance guest species reactivity. - Graphical abstract: The role of nature and amount of guest species on their respective localisation Evidence for full delocalisation of copper ions and diffusion pathways visualisation Display Omitted

OSTI ID:
21370439
Journal Information:
Journal of Solid State Chemistry, Vol. 182, Issue 6; Other Information: DOI: 10.1016/j.jssc.2009.03.017; PII: S0022-4596(09)00123-6; Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; ISSN 0022-4596
Country of Publication:
United States
Language:
English