skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Adjustable resonance frequency and linewidth by Zr doping in Co thin films

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.3260238· OSTI ID:21361931
; ; ;  [1]
  1. Key Laboratory for Magnetism and Magnetic Materials of MOE, Lanzhou University, Lanzhou 730000 (China)

Co{sub 100-x}Zr{sub x} (40 nm) thin films with different Zr compositions were grown on silicon substrates by radio frequency magnetron sputtering. The coercivity decreased with an increase in the Zr composition. A uniaxial anisotropy existed in the Co{sub 100-x}Zr{sub x} films, and the anisotropy field of the films decreased from 55 to 40 Oe with the increase of Zr composition. The resonance frequency and linewidth were decreased with the increase of the Zr composition during the permeability measurements. For samples with x=0 and 9, the magnetic anisotropy effective field and saturated field were obtained by fitting the external magnetic field dependent resonance frequency with Landau-Lifschitz-Gilbert equation. Therefore, it is an effective way to get the adjustable anisotropy field and linewidth, which is desirable for obtaining the high resonance and high permeability ferromagnetic film materials for high frequency application.

OSTI ID:
21361931
Journal Information:
Journal of Applied Physics, Vol. 106, Issue 10; Other Information: DOI: 10.1063/1.3260238; (c) 2009 American Institute of Physics; ISSN 0021-8979
Country of Publication:
United States
Language:
English