Crater effects on H and D emission from laser induced low-pressure helium plasma

Journal Article · Tue Sep 15 00:00:00 EDT 2009 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3224864· OSTI ID:21361823

Pardede, Marincan; Lie, Tjung Jie; Kurniawan, Koo Hendrik ^[1]; Niki, Hideaki; Fukumoto, Kenichi ^[2]; Maruyama, Tadashi ^[3]; Kagawa, Kiichiro ^[4]; Tjia, May On ^[5]

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1. Research Center of Maju Makmur Mandiri Foundation, 40/80 Srengseng Raya, Kembangan, Jakarta Barat 11630 (Indonesia)
2. Program of Nuclear Power and Energy Safety Engineering, Graduate School of Engineering, Fukui University, Fukui 910-8507 (Japan)
3. Integrated Research Institute, Tokyo Institute of Technology, 4259 Nagatsuda-cho, Midori-ku, Yokohama 226-8503 (Japan)
4. Department of Physics, Faculty of Education and Regional Studies, Fukui University, 9-1 bunkyo 3-chome, Fukui 910-8507 (Japan)
5. Physics of Magnetism and Photonics Research Group, Faculty of Mathematics and Natural Sciences, Bandung Institute of Technology, 10 Ganesha, Bandung 40132 (Indonesia)

An experimental study has been performed on the effects of crater depth on the hydrogen and deuterium emission intensities measured from laser plasmas generated in low-pressure helium ambient gas from zircaloy-4 samples doped with different H and D impurity concentrations as well as a standard brass sample for comparison. The results show that aside from emission of the host atom, the emission intensities of other ablated atoms of significantly smaller masses as well as that of the He atom generally exhibit relatively rapid initial decline with increasing crater depth. This trend was found to have its origin in the decreasing laser power density arriving at the crater bottom and thereby weakened the shock wave generated in the crater. As the crater deepened, the declining trend of the intensity appeared to level off as a result of compensation of the decreasing laser power density by the enhanced plasma confinement at increasing crater depth. Meanwhile, the result also reveals the significant contribution of the He-assisted excitation process to the doped hydrogen and deuterium emission intensities, leading to similar crater-depth dependent variation patterns in contrast to that associated with the surface water, with growing dominance of this common feature at the later stage of the plasma expansion. Therefore, a carefully chosen set of gate delay and gate width which are properly adapted to the crater-depth dependent behavior of the emission intensity may produce the desired intrinsic emission data for quantitative depth profiling of H impurity trapped inside the zircaloy wall.

• OSTI ID: 21361823
• Journal Information: Journal of Applied Physics, Vol. 106, Issue 6; Other Information: DOI: 10.1063/1.3224864; (c) 2009 American Institute of Physics; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BRASS
DEUTERIUM
DOPED MATERIALS
EMISSION
EXCITATION
HELIUM
HYDROGEN
LASERS
PLASMA
PLASMA CONFINEMENT
PLASMA DENSITY
PLASMA EXPANSION
PLASMA IMPURITIES
PLASMA PRODUCTION
POWER DENSITY
SHOCK WAVES
ZIRCALOY 4
ALLOYS
ALLOY-ZR98SN-4
CHROMIUM ADDITIONS
CHROMIUM ALLOYS
CONFINEMENT
COPPER ALLOYS
COPPER BASE ALLOYS
CORROSION RESISTANT ALLOYS
ELEMENTS
ENERGY-LEVEL TRANSITIONS
EXPANSION
FLUIDS
GASES
HEAT RESISTANT MATERIALS
HEAT RESISTING ALLOYS
HYDROGEN ISOTOPES
IMPURITIES
IRON ADDITIONS
IRON ALLOYS
ISOTOPES
LIGHT NUCLEI
MATERIALS
NONMETALS
NUCLEI
ODD-ODD NUCLEI
RARE GASES
STABLE ISOTOPES
TIN ALLOYS
TRANSITION ELEMENT ALLOYS
ZINC ALLOYS
ZIRCALOY
ZIRCONIUM ALLOYS
ZIRCONIUM BASE ALLOYS