Effect of epitaxial strain on the magneto-electric coupling of YMnO{sub 3} thin films
- School of Physical Sciences, Jawaharlal Nehru University, New Delhi 110067 (India)
- Department of Materials Science and Engineering, Nanostructured Materials Research Laboratory, University of Utah, Salt Lake City, Utah 84112 (United States)
We report synthesis of phase pure multiferroic YMnO{sub 3} thin films on sapphire (0001) with conducting ZnGaO buffer contact layer. Films were prepared by using pulsed laser deposition technique and characterized using x-ray diffraction, scanning electron microscopy, energy dispersive absorption spectroscopy, and magnetic field dependent dielectric measurement techniques. Structural characterizations indicated phase purity and epitaxial nature of the films. The dielectric response indicated an anomaly in dielectric constant epsilon and tan delta in the vicinity of 30 K, well below the bulk Neel temperature approx70 K. This anomaly in epsilon and tan delta and its magnetic field dependence is explained as an influence of strain due to lattice mismatch between the substrate and YMnO{sub 3} film. A substantial enhancement in magnetocapacitance was also observed for magnetic field applied parallel to ab plane of the film. Our results show that it is possible to tune the multiferroic property of YMnO{sub 3} via changes in ferroelastic route.
- OSTI ID:
- 21359297
- Journal Information:
- Journal of Applied Physics, Vol. 106, Issue 1; Other Information: DOI: 10.1063/1.3168423; (c) 2009 American Institute of Physics; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ABSORPTION SPECTROSCOPY
ANTIFERROMAGNETIC MATERIALS
CHEMICAL ANALYSIS
CRYSTAL DEFECTS
ENERGY BEAM DEPOSITION
EPITAXY
FERROELECTRIC MATERIALS
IMPURITIES
LASER RADIATION
MAGNETIC FIELDS
MAGNETIC PROPERTIES
NEEL TEMPERATURE
PERMITTIVITY
PULSED IRRADIATION
SAPPHIRE
SCANNING ELECTRON MICROSCOPY
THIN FILMS
X-RAY DIFFRACTION
YTTRIUM COMPOUNDS
ZINC COMPOUNDS
COHERENT SCATTERING
CORUNDUM
CRYSTAL GROWTH METHODS
CRYSTAL STRUCTURE
DEPOSITION
DIELECTRIC MATERIALS
DIELECTRIC PROPERTIES
DIFFRACTION
ELECTRICAL PROPERTIES
ELECTROMAGNETIC RADIATION
ELECTRON MICROSCOPY
FILMS
IRRADIATION
MAGNETIC MATERIALS
MATERIALS
MICROSCOPY
MINERALS
OXIDE MINERALS
PHYSICAL PROPERTIES
RADIATIONS
SCATTERING
SPECTROSCOPY
SURFACE COATING
THERMODYNAMIC PROPERTIES
TRANSITION ELEMENT COMPOUNDS
TRANSITION TEMPERATURE