Residual stress and magnetic behavior of multiferroic CoFe{sub 2}O{sub 4}/Pb(Zr{sub 0.52}Ti{sub 0.48})O{sub 3} thin films

Journal Article · Wed Apr 15 00:00:00 EDT 2009 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3115452· OSTI ID:21356119

Sim, Chow Hong; Pan, Z Z; Wang, John ^[1]

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1. Department of Materials Science and Engineering, Faculty of Engineering, National University of Singapore, Singapore 117574 (Singapore)

Multiferroic composite thin films consisting of CoFe{sub 2}O{sub 4} (CFO) and Pb(Zr{sub 0.52}Ti{sub 0.48})O{sub 3} (PZT) layers were deposited through a combined route of rf magnetron sputtering and sol gel on Pt(111)/TiO{sub 2}/SiO{sub 2}/Si substrates. The coupling effects in the bilayered thin film were studied by looking at the relationships among the crystallite orientation, magnetic behavior, and the in-plane residual stress. Phase selective residual stress analysis conducted by using x-ray method demonstrated a close correlation between the stress imposed on the PZT layer and its texture. A change in the PZT layer orientation from (111) to (010) with the increasing layer thickness was observed in the multiferroic thin film as the system changes from an interface energy minimizing texture to a strain energy density minimizing texture. The CFO phase in the multiferroic thin films was preferably oriented in the (111) orientation. However, there is a change in magnetization as well as coercivity of the multiferroic thin films when the top PZT layer was varied in thickness. A close correlation between the magnetization and the in-plane stress in the CFO bottom layer imposed by the PZT film thickness was observed.

• OSTI ID: 21356119
• Journal Information: Journal of Applied Physics, Vol. 105, Issue 8; Other Information: DOI: 10.1063/1.3115452; (c) 2009 American Institute of Physics; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COBALT OXIDES
COERCIVE FORCE
COMPOSITE MATERIALS
DEPOSITION
ELECTRICAL PROPERTIES
ENERGY DENSITY
FERROELECTRIC MATERIALS
FERROMAGNETIC MATERIALS
LAYERS
MAGNETIC PROPERTIES
MAGNETIZATION
PLATINUM
PZT
RESIDUAL STRESSES
SILICON
SILICON OXIDES
SOL-GEL PROCESS
SPUTTERING
TEXTURE
THICKNESS
THIN FILMS
TITANIUM OXIDES
X RADIATION
X-RAY DIFFRACTION
CHALCOGENIDES
COBALT COMPOUNDS
COHERENT SCATTERING
DIELECTRIC MATERIALS
DIFFRACTION
DIMENSIONS
ELECTROMAGNETIC RADIATION
ELEMENTS
FILMS
IONIZING RADIATIONS
LEAD COMPOUNDS
MAGNETIC MATERIALS
MATERIALS
METALS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
PLATINUM METALS
RADIATIONS
SCATTERING
SEMIMETALS
SILICON COMPOUNDS
STRESSES
TITANATES
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS
ZIRCONATES
ZIRCONIUM COMPOUNDS