X-ray dark-field and phase-contrast imaging using a grating interferometer

Journal Article · Fri May 15 00:00:00 EDT 2009 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3115639· OSTI ID:21352198

Pfeiffer, F ^[1]; Bech, M ^[2]; Bunk, O; Donath, T; Henrich, B; Kraft, P; David, C ^[3]

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1. Department of Physics, Technische Universitaet Muenchen, 85748 Garching (Germany)
2. Niels Bohr Institute, University of Copenhagen, 2100 Copenhagen (Denmark)
3. Paul Scherrer Institut, 5232 Villigen PSI (Switzerland)

In this letter, we report results obtained with a recently developed approach for grating-based x-ray dark-field imaging [F. Pfeiffer et al., Nat. Mater. 7, 134 (2008)]. Since the image contrast is formed through the mechanism of small-angle scattering, it provides complementary and otherwise inaccessible structural information about the specimen at the micron and submicron length scales. Our approach is fully compatible with conventional transmission radiography and the grating-based hard x-ray phase-contrast imaging scheme [F. Pfeiffer et al., Nat. Phys. 2, 258 (2006)]. Since it can be used with standard x-ray tube sources, we envisage widespread applications to x-ray medical imaging, industrial nondestructive testing, or security screening.

• OSTI ID: 21352198
• Journal Information: Journal of Applied Physics, Vol. 105, Issue 10; Other Information: DOI: 10.1063/1.3115639; (c) 2009 American Institute of Physics; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DIFFRACTION GRATINGS
HARD X RADIATION
IMAGES
INTERFEROMETERS
INTERFEROMETRY
NONDESTRUCTIVE TESTING
OPTICS
SMALL ANGLE SCATTERING
X-RAY TUBES
ELECTROMAGNETIC RADIATION
ELECTRON TUBES
EQUIPMENT
IONIZING RADIATIONS
MATERIALS TESTING
MEASURING INSTRUMENTS
RADIATIONS
SCATTERING
TESTING
X RADIATION
X-RAY EQUIPMENT