Real-time x-ray response of biocompatible solution gate AlGaN/GaN high electron mobility transistor devices
- Helmholtz Zentrum Muenchen, Ingolstaedter Landstrasse 1, 85764 Neuherberg (Germany)
- Walter Schottky Institut, Technische Universitaet Muenchen, Am Coulombwall 3, 85748 Garching (Germany)
We present the real-time x-ray irradiation response of charge and pH sensitive solution gate AlGaN/GaN high electron mobility transistors. The devices show stable and reproducible behavior under and following x-ray radiation, including a linear integrated response with dose into the muGy range. Titration measurements of devices in solution reveal that the linear pH response and sensitivity are not only retained under x-ray irradiation, but an irradiation response could also be measured. Since the devices are biocompatible, and can be simultaneously operated in aggressive fluids and under hard radiation, they are well-suited for both medical radiation dosimetry and biosensing applications.
- OSTI ID:
- 21347306
- Journal Information:
- Applied Physics Letters, Vol. 96, Issue 9; Other Information: DOI: 10.1063/1.3334682; (c) 2010 American Institute of Physics; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
Similar Records
Investigation of abrupt degradation of drain current caused by under-gate crack in AlGaN/GaN high electron mobility transistors during high temperature operation stress
Long-term stability assessment of AlGaN/GaN field effect transistors modified with peptides: Device characteristics vs. surface properties
pH sensor using AlGaN/GaN high electron mobility transistors with Sc{sub 2}O{sub 3} in the gate region
Journal Article
·
Mon Sep 28 00:00:00 EDT 2015
· Journal of Applied Physics
·
OSTI ID:21347306
+8 more
Long-term stability assessment of AlGaN/GaN field effect transistors modified with peptides: Device characteristics vs. surface properties
Journal Article
·
Tue Sep 15 00:00:00 EDT 2015
· AIP Advances
·
OSTI ID:21347306
+2 more
pH sensor using AlGaN/GaN high electron mobility transistors with Sc{sub 2}O{sub 3} in the gate region
Journal Article
·
Mon Jul 02 00:00:00 EDT 2007
· Applied Physics Letters
·
OSTI ID:21347306
+8 more
Related Subjects
36 MATERIALS SCIENCE
ALUMINIUM COMPOUNDS
DOSIMETRY
ELECTRON MOBILITY
GALLIUM NITRIDES
IRRADIATION
PH VALUE
SEMICONDUCTOR MATERIALS
SENSITIVITY
SENSORS
TITRATION
TRANSISTORS
X RADIATION
CHEMICAL ANALYSIS
ELECTROMAGNETIC RADIATION
GALLIUM COMPOUNDS
IONIZING RADIATIONS
MATERIALS
MOBILITY
NITRIDES
NITROGEN COMPOUNDS
PARTICLE MOBILITY
PNICTIDES
QUANTITATIVE CHEMICAL ANALYSIS
RADIATIONS
SEMICONDUCTOR DEVICES
VOLUMETRIC ANALYSIS
ALUMINIUM COMPOUNDS
DOSIMETRY
ELECTRON MOBILITY
GALLIUM NITRIDES
IRRADIATION
PH VALUE
SEMICONDUCTOR MATERIALS
SENSITIVITY
SENSORS
TITRATION
TRANSISTORS
X RADIATION
CHEMICAL ANALYSIS
ELECTROMAGNETIC RADIATION
GALLIUM COMPOUNDS
IONIZING RADIATIONS
MATERIALS
MOBILITY
NITRIDES
NITROGEN COMPOUNDS
PARTICLE MOBILITY
PNICTIDES
QUANTITATIVE CHEMICAL ANALYSIS
RADIATIONS
SEMICONDUCTOR DEVICES
VOLUMETRIC ANALYSIS