Near edge x-ray absorption fine structure spectroscopy with x-ray free-electron lasers

Journal Article · Mon Sep 28 00:00:00 EDT 2009 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.3236540· OSTI ID:21308710

Bernstein, D P; Acremann, Y; Scherz, A; Burkhardt, M; Stoehr, J ^[1]; Beye, M; Schlotter, W F; Beeck, T; Sorgenfrei, F; Pietzsch, A; Wurth, W; Foehlisch, A ^[2]

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1. SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025 (United States)
2. Institut fuer Experimentalphysik and Centre for Free-Electron Laser Science, Universitaet Hamburg, Luruper Chaussee 149, 22761 Hamburg (Germany)

We demonstrate the feasibility of near edge x-ray absorption fine structure spectroscopy on solids by means of femtosecond soft x-ray pulses from a free-electron laser (FEL). Our experiments, carried out at the FEL at Hamburg used a special sample geometry, spectrographic energy dispersion, single shot position-sensitive detection, and a data normalization procedure that eliminates the severe fluctuations of the incident intensity in space and photon energy. As an example, we recorded the {sup 3}D{sub 1} N{sub 4,5} edge absorption resonance of La{sup 3+} ions in LaMnO{sub 3}. Our study opens the door for x-ray absorption measurements on future x-ray FEL facilities.

• OSTI ID: 21308710
• Journal Information: Applied Physics Letters, Vol. 95, Issue 13; Other Information: DOI: 10.1063/1.3236540; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION
ABSORPTION SPECTROSCOPY
FINE STRUCTURE
FREE ELECTRON LASERS
LANTHANUM COMPOUNDS
LANTHANUM IONS
MANGANATES
PHOTONS
SOFT X RADIATION
X-RAY LASERS
X-RAY SPECTROSCOPY