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Title: Spin polarization of Fe{sub 4}N thin films determined by point-contact Andreev reflection

Abstract

The spin polarization of (100)-oriented {gamma}{sup '}-Fe{sub 4}N layers grown on MgO(001) substrates by molecular beam epitaxy was deduced from point contact Andreev reflection measurements, and the value was compared with that of {alpha}-Fe. The spin polarization (P) for {gamma}{sup '}-Fe{sub 4}N is approximately 0.59 at 7.8 K. This value is distinctly larger than that for {alpha}-Fe (P=0.49 at 7.8 K) measured with an identical setting. The mechanism of enhanced spin polarization in {gamma}{sup '}-Fe{sub 4}N is discussed.

Authors:
; ;  [1]; ; ;  [2]
  1. Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennohdai, Tsukuba, Ibaraki 305-8573 (Japan)
  2. National Institute for Materials Science, Tsukuba 305-0047, Japan and University of Tsukuba, Tsukuba 305-0047 (Japan)
Publication Date:
OSTI Identifier:
21294084
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 94; Journal Issue: 20; Other Information: DOI: 10.1063/1.3140459; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CRYSTAL GROWTH; ELECTRIC CONTACTS; IRON NITRIDES; IRON-ALPHA; LAYERS; MAGNESIUM OXIDES; MOLECULAR BEAM EPITAXY; SPIN; SPIN ORIENTATION; SUBSTRATES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0000-0013 K; THIN FILMS

Citation Formats

Narahara, A, Ito, K, Suemasu, T, Takahashi, Y K, Ranajikanth, A, and Hono, K. Spin polarization of Fe{sub 4}N thin films determined by point-contact Andreev reflection. United States: N. p., 2009. Web. doi:10.1063/1.3140459.
Narahara, A, Ito, K, Suemasu, T, Takahashi, Y K, Ranajikanth, A, & Hono, K. Spin polarization of Fe{sub 4}N thin films determined by point-contact Andreev reflection. United States. https://doi.org/10.1063/1.3140459
Narahara, A, Ito, K, Suemasu, T, Takahashi, Y K, Ranajikanth, A, and Hono, K. 2009. "Spin polarization of Fe{sub 4}N thin films determined by point-contact Andreev reflection". United States. https://doi.org/10.1063/1.3140459.
@article{osti_21294084,
title = {Spin polarization of Fe{sub 4}N thin films determined by point-contact Andreev reflection},
author = {Narahara, A and Ito, K and Suemasu, T and Takahashi, Y K and Ranajikanth, A and Hono, K},
abstractNote = {The spin polarization of (100)-oriented {gamma}{sup '}-Fe{sub 4}N layers grown on MgO(001) substrates by molecular beam epitaxy was deduced from point contact Andreev reflection measurements, and the value was compared with that of {alpha}-Fe. The spin polarization (P) for {gamma}{sup '}-Fe{sub 4}N is approximately 0.59 at 7.8 K. This value is distinctly larger than that for {alpha}-Fe (P=0.49 at 7.8 K) measured with an identical setting. The mechanism of enhanced spin polarization in {gamma}{sup '}-Fe{sub 4}N is discussed.},
doi = {10.1063/1.3140459},
url = {https://www.osti.gov/biblio/21294084}, journal = {Applied Physics Letters},
issn = {0003-6951},
number = 20,
volume = 94,
place = {United States},
year = {Mon May 18 00:00:00 EDT 2009},
month = {Mon May 18 00:00:00 EDT 2009}
}