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Title: An Efficient Referencing And Sample Positioning System To Investigate Heterogeneous Substances With Combined Microfocused Synchrotron X-ray Techniques

Abstract

A referencing and sample positioning system has been developed to transfer object positions measured with an offline microscope to a synchrotron experimental station. The accuracy should be sufficient to deal with heterogeneous samples on micrometer scale. Together with an online fluorescence mapping visualisation the optical alignment helps to optimize measuring procedures for combined microfocused X-ray techniques.

Authors:
; ;  [1]
  1. Forschimgszentrum Karlsruhe GmbH, Institute for Synchrotron Radiation, Synchrotron Radiation Source ANKA, Hermann-von-Helmholtz-Platz 1, 76344 Eggenstein-Leopoldshafen (Germany)
Publication Date:
OSTI Identifier:
21260239
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 1092; Journal Issue: 1; Conference: 6. international conference on synchrotron radiation in materials science, Campinas (Brazil), 20-23 Jul 2008; Other Information: DOI: 10.1063/1.3086243; (c) 2009 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
39; ACCURACY; ALIGNMENT; FLUORESCENCE; MICROSCOPES; NANOSTRUCTURES; POSITIONING; SYNCHROTRON RADIATION; SYNCHROTRONS; TOPOGRAPHY; X RADIATION

Citation Formats

Spangenberg, Thomas, Goettlicher, Joerg, and Steininger, Ralph. An Efficient Referencing And Sample Positioning System To Investigate Heterogeneous Substances With Combined Microfocused Synchrotron X-ray Techniques. United States: N. p., 2009. Web. doi:10.1063/1.3086243.
Spangenberg, Thomas, Goettlicher, Joerg, & Steininger, Ralph. An Efficient Referencing And Sample Positioning System To Investigate Heterogeneous Substances With Combined Microfocused Synchrotron X-ray Techniques. United States. https://doi.org/10.1063/1.3086243
Spangenberg, Thomas, Goettlicher, Joerg, and Steininger, Ralph. Thu . "An Efficient Referencing And Sample Positioning System To Investigate Heterogeneous Substances With Combined Microfocused Synchrotron X-ray Techniques". United States. https://doi.org/10.1063/1.3086243.
@article{osti_21260239,
title = {An Efficient Referencing And Sample Positioning System To Investigate Heterogeneous Substances With Combined Microfocused Synchrotron X-ray Techniques},
author = {Spangenberg, Thomas and Goettlicher, Joerg and Steininger, Ralph},
abstractNote = {A referencing and sample positioning system has been developed to transfer object positions measured with an offline microscope to a synchrotron experimental station. The accuracy should be sufficient to deal with heterogeneous samples on micrometer scale. Together with an online fluorescence mapping visualisation the optical alignment helps to optimize measuring procedures for combined microfocused X-ray techniques.},
doi = {10.1063/1.3086243},
url = {https://www.osti.gov/biblio/21260239}, journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1092,
place = {United States},
year = {2009},
month = {1}
}