The Calculation Of Absorbing Thin Film Optical Constants And Electronic Structure From Photometric Measures On Domain IR-VIS-UV Using Neural Networks
- Faculty of science and Engineering University of Guelma, BP 401 Guelma 24000 (Algeria)
- Laboratory of semi conductors, University of Badji Mokhtar, Annaba (Algeria)
- Electrical Engineering Laboratory (LGEG), University of Guelma, BP 401, 24000 (Algeria)
In this paper a new method using the combination of Neural Networks and the Newton-Raphson algorithm is developped. The technique consists of the use of the solution obtained by Newton-Raphson algorithm between 0.5 and 2.1eV for pure manganese (Mn) and for the amorphous metallic alloy Al{sub 88}Mn{sub 12}, to construct two parts of datasets; the first one is used for training the neural network and the second one for the validation tests. The validated neural network model is applied to the determination of optical constants of the two materials Mn and Al{sub 88}Mn{sub 12} in the range of 0.5 and 6.2eV (IR-VIS-UV). The results obtained over all the studied energy range are used to trace back to dielectric function, optical absorption and electronic structure of the same material. By using the partial solution obtained by Newton-Raphson as a database of the neural network prediction model, it is shown that the obtained results are in accordance with those of the literature which consolidate the efficiency of the suggested approach.
- OSTI ID:
- 21251406
- Journal Information:
- AIP Conference Proceedings, Vol. 1047, Issue 1; Conference: LAPAMS'08: 1. international conference on laser plasma applications in materials science, Algiers (Algeria), 23-26 Jun 2008; Other Information: DOI: 10.1063/1.2999959; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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