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Title: Preparation, crystal structure, and photoluminescence of Ca{sub 2}SnO{sub 4}:Eu{sup 3+}, Y{sup 3+}

Journal Article · · Journal of Solid State Chemistry
 [1]; ;  [1];  [1]
  1. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577 (Japan)

Eu{sup 3+}-doped Ca{sub 2}SnO{sub 4} (solid solutions of Ca{sub 2-x}Eu{sub 2x}Sn{sub 1-x}O{sub 4}, 0{<=}x{<=}0.3) and Eu{sup 3+} and Y{sup 3+}-codoped Ca{sub 2}SnO{sub 4} (Ca{sub 1.8}Y{sub 0.2}Eu{sub 0.2}Sn{sub 0.8}O{sub 4}) were prepared by solid-state reaction at 1400 deg. C in air. Rietveld analysis of the X-ray powder diffraction patterns revealed that Eu{sup 3+} replaced Ca{sup 2+} and Sn{sup 4+} in Eu{sup 3+}-doped Ca{sub 2}SnO{sub 4}, and that Eu{sup 3+} replaced Ca{sup 2+} and Y{sup 3+} replaced Sn{sup 4+} in Ca{sub 1.8}Y{sub 0.2}Eu{sub 0.2}Sn{sub 0.8}O{sub 4}. Red luminescence at 616 nm due to the electric dipole transition {sup 5}D{sub o}{yields}{sup 7}F{sub 2} was observed in the photoluminescence (PL) spectra of Ca{sub 2-x}Eu{sub 2x}Sn{sub 1-x}O{sub 4} and Ca{sub 1.8}Y{sub 0.2}Eu{sub 0.2}Sn{sub 0.8}O{sub 4} at room temperature. The maximum PL intensity in the solid solutions of Ca{sub 2-x}Eu{sub 2x}Sn{sub 1-x}O{sub 4} was obtained for x=0.1. The PL intensity of Ca{sub 1.8}Y{sub 0.2}Eu{sub 0.2}Sn{sub 0.8}O{sub 4} was 1.26 times greater than that of Ca{sub 2-x}Eu{sub 2x}Sn{sub 1-x}O{sub 4} with x=0.1. - Graphical abstract: Rietveld analysis of the X-ray powder diffraction patterns revealed that Eu{sup 3+} replaced Ca{sup 2+} and Sn{sup 4+} in Ca{sub 2-x}Eu{sub 2x}Sn{sub 1-x}O{sub 4}, (0{<=}x{<=}0.3), and Eu{sup 3+} replaced Ca{sup 2+} and Y{sup 3+} replaced Sn{sup 4+} in Ca{sub 1.8}Y{sub 0.2}Eu{sub 0.2}Sn{sub 0.8}O{sub 4}. Red luminescence at 616 nm due to the {sup 5}D{sub o}{yields}{sup 7}F{sub 2} transition was observed in the photoluminescence spectra of these compounds.

OSTI ID:
21212032
Journal Information:
Journal of Solid State Chemistry, Vol. 181, Issue 10; Other Information: DOI: 10.1016/j.jssc.2008.06.033; PII: S0022-4596(08)00329-0; Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
Country of Publication:
United States
Language:
English