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Title: Phase contrast imaging simulation and measurements using polychromatic sources with small source-object distances

Abstract

Phase contrast imaging is a technique widely used in synchrotron facilities for nondestructive analysis. Such technique can also be implemented through microfocus x-ray tube systems. Recently, a relatively new type of compact, quasimonochromatic x-ray sources based on Compton backscattering has been proposed for phase contrast imaging applications. In order to plan a phase contrast imaging system setup, to evaluate the system performance and to choose the experimental parameters that optimize the image quality, it is important to have reliable software for phase contrast imaging simulation. Several software tools have been developed and tested against experimental measurements at synchrotron facilities devoted to phase contrast imaging. However, many approximations that are valid in such conditions (e.g., large source-object distance, small transverse size of the object, plane wave approximation, monochromatic beam, and Gaussian-shaped source focal spot) are not generally suitable for x-ray tubes and other compact systems. In this work we describe a general method for the simulation of phase contrast imaging using polychromatic sources based on a spherical wave description of the beam and on a double-Gaussian model of the source focal spot, we discuss the validity of some possible approximations, and we test the simulations against experimental measurements using a microfocusmore » x-ray tube on three types of polymers (nylon, poly-ethylene-terephthalate, and poly-methyl-methacrylate) at varying source-object distance. It will be shown that, as long as all experimental conditions are described accurately in the simulations, the described method yields results that are in good agreement with experimental measurements.« less

Authors:
; ; ; ;  [1]; ; ;  [2]
  1. Strutt. Dip. di Matematica e Fisica, Universita di Sassari, Italy and INFN, Sez. di Cagliari (Italy)
  2. Dipartimento di Fisica, Universita di Pisa, Italy and INFN, Sez. di Pisa (Italy)
Publication Date:
OSTI Identifier:
21185884
Resource Type:
Journal Article
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 104; Journal Issue: 9; Other Information: DOI: 10.1063/1.3006130; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0021-8979
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; APPROXIMATIONS; BACKSCATTERING; COMPUTER CODES; ETHYLENE; GAUSSIAN PROCESSES; METHACRYLIC ACID ESTERS; MONOCHROMATIC RADIATION; NONDESTRUCTIVE ANALYSIS; NONDESTRUCTIVE TESTING; NYLON; SIMULATION; SYNCHROTRONS; WAVE PROPAGATION; X-RAY SOURCES; X-RAY TUBES

Citation Formats

Golosio, Bruno, Carpinelli, Massimo, Masala, Giovanni Luca, Oliva, Piernicola, Stumbo, Simone, Delogu, Pasquale, Zanette, Irene, and Stefanini, Arnaldo. Phase contrast imaging simulation and measurements using polychromatic sources with small source-object distances. United States: N. p., 2008. Web. doi:10.1063/1.3006130.
Golosio, Bruno, Carpinelli, Massimo, Masala, Giovanni Luca, Oliva, Piernicola, Stumbo, Simone, Delogu, Pasquale, Zanette, Irene, & Stefanini, Arnaldo. Phase contrast imaging simulation and measurements using polychromatic sources with small source-object distances. United States. https://doi.org/10.1063/1.3006130
Golosio, Bruno, Carpinelli, Massimo, Masala, Giovanni Luca, Oliva, Piernicola, Stumbo, Simone, Delogu, Pasquale, Zanette, Irene, and Stefanini, Arnaldo. Sat . "Phase contrast imaging simulation and measurements using polychromatic sources with small source-object distances". United States. https://doi.org/10.1063/1.3006130.
@article{osti_21185884,
title = {Phase contrast imaging simulation and measurements using polychromatic sources with small source-object distances},
author = {Golosio, Bruno and Carpinelli, Massimo and Masala, Giovanni Luca and Oliva, Piernicola and Stumbo, Simone and Delogu, Pasquale and Zanette, Irene and Stefanini, Arnaldo},
abstractNote = {Phase contrast imaging is a technique widely used in synchrotron facilities for nondestructive analysis. Such technique can also be implemented through microfocus x-ray tube systems. Recently, a relatively new type of compact, quasimonochromatic x-ray sources based on Compton backscattering has been proposed for phase contrast imaging applications. In order to plan a phase contrast imaging system setup, to evaluate the system performance and to choose the experimental parameters that optimize the image quality, it is important to have reliable software for phase contrast imaging simulation. Several software tools have been developed and tested against experimental measurements at synchrotron facilities devoted to phase contrast imaging. However, many approximations that are valid in such conditions (e.g., large source-object distance, small transverse size of the object, plane wave approximation, monochromatic beam, and Gaussian-shaped source focal spot) are not generally suitable for x-ray tubes and other compact systems. In this work we describe a general method for the simulation of phase contrast imaging using polychromatic sources based on a spherical wave description of the beam and on a double-Gaussian model of the source focal spot, we discuss the validity of some possible approximations, and we test the simulations against experimental measurements using a microfocus x-ray tube on three types of polymers (nylon, poly-ethylene-terephthalate, and poly-methyl-methacrylate) at varying source-object distance. It will be shown that, as long as all experimental conditions are described accurately in the simulations, the described method yields results that are in good agreement with experimental measurements.},
doi = {10.1063/1.3006130},
url = {https://www.osti.gov/biblio/21185884}, journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 9,
volume = 104,
place = {United States},
year = {2008},
month = {11}
}