X-ray imaging characteristics of a direct conversion detector using selenium and thin film transistor array
Journal Article
·
· AIP Conference Proceedings
- Sterling Diagnostic Imaging, Inc., P.O. Box 6101, Newark, Delaware 19714-6101 (United States)
No abstract prepared.
- OSTI ID:
- 21179528
- Journal Information:
- AIP Conference Proceedings, Vol. 417, Issue 1; Conference: 10. United States national conference on synchrotron radiation instrumentation, Ithaca, NY (United States), 17-20 Jun 1997; Other Information: DOI: 10.1063/1.54604; (c) 1997 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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