Measurement of edge density profiles of Large Helical Device plasmas using an ultrashort-pulse reflectometer

Journal Article · Thu May 15 00:00:00 EDT 2008 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2917579· OSTI ID:21123937

Yokota, Y; Mase, A; Kogi, Y; Bruskin, L G ^[1]; Tokuzawa, T; Kawahata, K ^[2]

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1. Art, Science and Technology Center for Cooperative Research, Kyushu University, Kasuga 816-8580 (Japan)
2. National Institute for Fusion Science, Toki 509-5292 (Japan)

We report here on the application of an ultrashort-pulse reflectometer (USPR) to Large Helical Device in National Institute for Fusion Science. An impulse with picosecond pulse width is used as a source in an USPR. Since the bandwidth of a source is inversely related to the pulse width, we can utilize the frequency range of microwave to millimeter-wave by using wide band transmission lines. The density profiles can be reconstructed by collecting time-of-flight signal of each frequency component of an impulse reflected from each cutoff layer. Remote control system using super science information network has been introduced to the present USPR system.

• OSTI ID: 21123937
• Journal Information: Review of Scientific Instruments, Vol. 79, Issue 5; Other Information: DOI: 10.1063/1.2917579; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BOUNDARY LAYERS
DENSITY
FREQUENCY RANGE
LHD DEVICE
MICROWAVE RADIATION
PLASMA
PLASMA CONFINEMENT
PLASMA DENSITY
PLASMA DIAGNOSTICS
POWER TRANSMISSION LINES
PULSES
REMOTE CONTROL
STELLARATORS
TIME-OF-FLIGHT METHOD