X-ray-excited photoelectron detection using a scanning tunneling microscope

Journal Article · Mon May 12 00:00:00 EDT 2008 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2936083· OSTI ID:21102056

Rose, V; Freeland, J W ^[1]; Gray, K E ^[2]; Streiffer, S K ^[3]

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1. Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
2. Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
3. Center for Nanoscale Materials, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

Detection of x-ray-enhanced electrons emitted by synchrotron radiation with the tip of a scanning tunneling microscope has the potential to open a path to high-resolution microscopy with chemical sensitivity. Nonresonant photoejected electrons typically yield a current background of a few hundred picoamperes at a bare tip. Coating the tip with an insulating boron nitride film can effectively reduce this background. In this configuration, we have quantitatively studied the bias dependent photoelectron collection for tip/sample separations of 400-1600 nm, where quantum mechanical tunneling does not contribute.

• OSTI ID: 21102056
• Journal Information: Applied Physics Letters, Vol. 92, Issue 19; Other Information: DOI: 10.1063/1.2936083; (c) 2008 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BORON NITRIDES
ELECTRONS
QUANTUM MECHANICS
SCANNING TUNNELING MICROSCOPY
SENSITIVITY
SYNCHROTRON RADIATION
THIN FILMS
TUNNEL EFFECT
X RADIATION