A technique for determining thermal expansion coefficients in cubic, tetragonal, hexagonal, and orthorhombic crystals

Journal Article · Mon May 15 00:00:00 EDT 2006 · Crystallography Reports

DOI:https://doi.org/10.1134/S1063774506030187· OSTI ID:21091474

Orlova, A I; Kazantsev, G N ^[1]; Bankrashkov, A V ^[2]

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1. Nizhni Novgorod State University (Russian Federation)
2. Institute of Physics and Power Engineering (Russian Federation)

A set of measured thermal shifts {l_brace}{delta}{theta}{sub i}{r_brace} of diffraction peaks is numerically processed by introducing special variables z{sub i}, y{sub i}, and x{sub i}, and linear relations are obtained between the thermal shifts characterized by the values of z{sub i} as functions of the variables x{sub i} and y{sub i}, which depend on the crystal-plane indices and the unit-cell parameters of the crystal. After the least-squares fit, these relations can be represented in a graphical form. The thermal expansion coefficients are determined directly from these plots or analytically.

• OSTI ID: 21091474
• Journal Information: Crystallography Reports, Vol. 51, Issue 3; Other Information: DOI: 10.1134/S1063774506030187; Copyright (c) 2006 Nauka/Interperiodica; Article Copyright (c) 2006 Pleiades Publishing, Inc; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7745
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTALS
CUBIC LATTICES
DIFFRACTION
HEXAGONAL LATTICES
LEAST SQUARE FIT
ORTHORHOMBIC LATTICES
TETRAGONAL LATTICES
THERMAL EXPANSION