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Title: Strongly exhanced secondary ion yields in TOF-SIMS studies with very highly charged primary ions up to Th{sup 71+}

Abstract

The advent of new ion source technologies, such as the LLNL EBIT (Electron Beam Ion Trap), has made low emittance ({approximately}0.2 {pi} mm mrad) beams of slow (several keV/amu) very highly charged ions (up to U{sup 92+}) accessible for ion solid interaction studies. The prominent feature in the interaction of highly charged ions with surfaces, compared to conventional singly charged ions, is a dominance of electronic over collisional effects. Up to several hundreds of electrons (for Th{sup 70+} on Au{sup 2}) are emitted from an area of a few square nanometers per incident ion. In insulators, this local disturbance of the charge equilibrium produces a {open_quotes}Coulomb explosion{close_quotes}, resulting in the emission of large numbers of secondary particles, and the production of nanometer size defects.

Authors:
; ; ;  [1]
  1. Lawrence Livermore National Lab., CA (United States)
Publication Date:
OSTI Identifier:
210741
Report Number(s):
CONF-9505261-
TRN: 96:001157-0180
Resource Type:
Conference
Resource Relation:
Conference: 43. American Society of Mass Spectrometry (ASMS) conference on mass spectrometry and allied topics, Atlanta, GA (United States), 21-26 May 1995; Other Information: PBD: 1995; Related Information: Is Part Of Proceedings of the 43rd ASMS conference on mass spectrometry and allied topics; PB: 1411 p.
Country of Publication:
United States
Language:
English
Subject:
40 CHEMISTRY; 66 PHYSICS; SILICA; ION MICROPROBE ANALYSIS; MASS SPECTROSCOPY; THORIUM; TIME-OF-FLIGHT MASS SPECTROMETERS; RADIOACTIVE ION BEAMS

Citation Formats

Schenkel, T, Briere, M A, Schach van Wittenau, A E, and Schneider, D. Strongly exhanced secondary ion yields in TOF-SIMS studies with very highly charged primary ions up to Th{sup 71+}. United States: N. p., 1995. Web.
Schenkel, T, Briere, M A, Schach van Wittenau, A E, & Schneider, D. Strongly exhanced secondary ion yields in TOF-SIMS studies with very highly charged primary ions up to Th{sup 71+}. United States.
Schenkel, T, Briere, M A, Schach van Wittenau, A E, and Schneider, D. Sun . "Strongly exhanced secondary ion yields in TOF-SIMS studies with very highly charged primary ions up to Th{sup 71+}". United States.
@article{osti_210741,
title = {Strongly exhanced secondary ion yields in TOF-SIMS studies with very highly charged primary ions up to Th{sup 71+}},
author = {Schenkel, T and Briere, M A and Schach van Wittenau, A E and Schneider, D},
abstractNote = {The advent of new ion source technologies, such as the LLNL EBIT (Electron Beam Ion Trap), has made low emittance ({approximately}0.2 {pi} mm mrad) beams of slow (several keV/amu) very highly charged ions (up to U{sup 92+}) accessible for ion solid interaction studies. The prominent feature in the interaction of highly charged ions with surfaces, compared to conventional singly charged ions, is a dominance of electronic over collisional effects. Up to several hundreds of electrons (for Th{sup 70+} on Au{sup 2}) are emitted from an area of a few square nanometers per incident ion. In insulators, this local disturbance of the charge equilibrium produces a {open_quotes}Coulomb explosion{close_quotes}, resulting in the emission of large numbers of secondary particles, and the production of nanometer size defects.},
doi = {},
url = {https://www.osti.gov/biblio/210741}, journal = {},
number = ,
volume = ,
place = {United States},
year = {1995},
month = {12}
}

Conference:
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