Effects of post-deposition heat treatment on the optical characteristics of ZnTe thin films

Journal Article · Mon Apr 23 00:00:00 EDT 2007 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.2733382· OSTI ID:21057230

Prepelita, P; Rusu, G I ^[1]; Pirghie, C ^[2]

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1. Faculty of Physics Al. I. Cuza University, 11 Carol I Blvd. Iasi, R-700506 (Romania)
2. Faculty of Mechanical Engineering, 'Stefan cal Mare' University, 9 Universitatii Str., 720225 Suceava (Romania)

Zinc telluride (ZnTe) thin films (d=0.15 {mu}m - 2.40 {mu}m) were deposited by quasi-closed volume technique under vacuum. X-ray diffraction patterns indicated that the films are polycrystalline and have a zinc blende structure. After a heat treatment, a significant increase of peak intensities, corresponding to (220) plane take place. The heat treatment determines a greater dispersion of crystallite height as compare to the not treated once. After heat treatment the transmission coefficient strongly decreases. The values of optical bandgap ranged between 1.95 eV and 2.40 eV, due to heat treatment.

• OSTI ID: 21057230
• Journal Information: AIP Conference Proceedings, Vol. 899, Issue 1; Conference: 6. international conference of the Balkan Physical Union, Istanbul (Turkey), 22-26 Aug 2006; Other Information: DOI: 10.1063/1.2733382; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COMPARATIVE EVALUATIONS
CUBIC LATTICES
DEPOSITION
ENERGY GAP
EV RANGE
HEAT TREATMENTS
POLYCRYSTALS
SEMICONDUCTOR MATERIALS
THIN FILMS
X-RAY DIFFRACTION
ZINC TELLURIDES