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Title: An Ion Chamber Dedicated to Carbon NEXAFS: Removal of High-Order X-Rays and Reliable Flux Measurement

Abstract

The difficulty of performing a reliable carbon NEXAFS measurement for thin films and adsorbate systems has long been recognized. The difficulty is typically related to lower S/B, carbon buildup in beamline optics, dirty mesh, presence of the high-order x-rays, etc. To alleviate the experimental difficulty, we have constructed an intensity-monitoring ion chamber situated between the beamline and sample chamber. The ion chamber is filled with argon up to a working pressure of 10-3 Torr and terminated with 0.1 {mu}m thick Ti foils at both ends. Titanium foils and the filled argon gas effectively remove the high-order x-rays. Consequently, the data are acquired with predominant 1st-order x-rays and thus free of the aforementioned interference, leading to a more reliable data analysis.

Authors:
; ;  [1]
  1. National Synchrotron Radiation Research Center, Hsinchu, Taiwan 30076 (China)
Publication Date:
OSTI Identifier:
21054780
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 882; Journal Issue: 1; Conference: XAFS13: 13. international conference on X-ray absorption fine structure, Stanford, CA (United States), 9-14 Jul 2006; Other Information: DOI: 10.1063/1.2644705; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ABSORPTION SPECTROSCOPY; ARGON; BEAM MONITORING; BEAM OPTICS; BEAM PRODUCTION; CARBON; DATA ANALYSIS; FINE STRUCTURE; FOILS; INTERFERENCE; IONIZATION CHAMBERS; PHOTON BEAMS; THIN FILMS; TITANIUM; X RADIATION; X-RAY SPECTROSCOPY

Citation Formats

Fan, L.-J., Yang, Y.-W., and Lee, Kaidee. An Ion Chamber Dedicated to Carbon NEXAFS: Removal of High-Order X-Rays and Reliable Flux Measurement. United States: N. p., 2007. Web. doi:10.1063/1.2644705.
Fan, L.-J., Yang, Y.-W., & Lee, Kaidee. An Ion Chamber Dedicated to Carbon NEXAFS: Removal of High-Order X-Rays and Reliable Flux Measurement. United States. doi:10.1063/1.2644705.
Fan, L.-J., Yang, Y.-W., and Lee, Kaidee. Fri . "An Ion Chamber Dedicated to Carbon NEXAFS: Removal of High-Order X-Rays and Reliable Flux Measurement". United States. doi:10.1063/1.2644705.
@article{osti_21054780,
title = {An Ion Chamber Dedicated to Carbon NEXAFS: Removal of High-Order X-Rays and Reliable Flux Measurement},
author = {Fan, L.-J. and Yang, Y.-W. and Lee, Kaidee},
abstractNote = {The difficulty of performing a reliable carbon NEXAFS measurement for thin films and adsorbate systems has long been recognized. The difficulty is typically related to lower S/B, carbon buildup in beamline optics, dirty mesh, presence of the high-order x-rays, etc. To alleviate the experimental difficulty, we have constructed an intensity-monitoring ion chamber situated between the beamline and sample chamber. The ion chamber is filled with argon up to a working pressure of 10-3 Torr and terminated with 0.1 {mu}m thick Ti foils at both ends. Titanium foils and the filled argon gas effectively remove the high-order x-rays. Consequently, the data are acquired with predominant 1st-order x-rays and thus free of the aforementioned interference, leading to a more reliable data analysis.},
doi = {10.1063/1.2644705},
journal = {AIP Conference Proceedings},
number = 1,
volume = 882,
place = {United States},
year = {Fri Feb 02 00:00:00 EST 2007},
month = {Fri Feb 02 00:00:00 EST 2007}
}