Simultaneous Detection of X-Ray Fluorescence and Conversion Electrons for Depth Selective XAFS Analysis
- Department of Applied Chemistry, Graduate School of Engineering, Hiroshima University, Hiroshima (Japan)
- Hiroshima Synchrotron Radiation Center (HSRC), Hiroshima University, Hiroshima, (Japan)
- Graduate School of Energy Science, Kyoto University, Kyoto (Japan)
An apparatus has been developed, which enables us to monitor both x-ray fluorescence yield (XFY) and conversion electron yield (CEY) from a sample. The apparatus has been installed to the BL11 of HSRC, and its basic performance has been evaluated. The detection limit of X-ray fluorescence analysis is 1.5 ppm for Ca and 6.6 ppm for S when the incident x-ray energy is optimized just above the absorption edge energy. The probing depth of the CEY method is estimated to be 4.0 nm for Ag thin films around Ag LIII edge while the escape depth of the x-ray fluorescence is more than 1 {mu}m The near surface sensitivity of the CEY is advantageous for XAFS measurements because x-ray fluorescence mode may suffer self-absorption-effects.
- OSTI ID:
- 21054764
- Journal Information:
- AIP Conference Proceedings, Vol. 882, Issue 1; Conference: XAFS13: 13. international conference on X-ray absorption fine structure, Stanford, CA (United States), 9-14 Jul 2006; Other Information: DOI: 10.1063/1.2644687; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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