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Title: Multiple Scattering Approach to Polarization Dependence of F K-Edge XANES Spectra for Highly Oriented Polytetrafluoroethylene (PTFE) Thin Film

Abstract

The polarization dependence of F K-edge X-ray absorption near edge structure (XANES) spectra of highly-oriented thin-film of polytetrafluoroethylene (PTFE) has been analyzed by using multiple scattering theory. The spectra show clear polarization dependence due to the highly-oriented structure. The multiple scattering calculations reflects a local structure around an absorbing atom. The calculated results obtained by considering intermolecular-interactions are in good agreement with the observed polarization-dependence. We have also analyzed structural models of the radiation damaged PTFE films.

Authors:
; ; ; ; ;  [1]
  1. Graduate School of Sci. and Tech., Chiba Univ., Yayoicho 1-33, Inage-ku Chiba 263-8522 (Japan)
Publication Date:
OSTI Identifier:
21054669
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 882; Journal Issue: 1; Conference: XAFS13: 13. international conference on X-ray absorption fine structure, Stanford, CA (United States), 9-14 Jul 2006; Other Information: DOI: 10.1063/1.2644577; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; ATOMS; INTERMOLECULAR FORCES; MULTIPLE SCATTERING; NUMERICAL ANALYSIS; POLARIZATION; POLYTETRAFLUOROETHYLENE; STRUCTURAL MODELS; THIN FILMS; X RADIATION; X-RAY SPECTRA; X-RAY SPECTROSCOPY

Citation Formats

Nagamatsu, S., Ono, M., Kera, S., Okudaira, K. K., Fujikawa, T., and Ueno, N. Multiple Scattering Approach to Polarization Dependence of F K-Edge XANES Spectra for Highly Oriented Polytetrafluoroethylene (PTFE) Thin Film. United States: N. p., 2007. Web. doi:10.1063/1.2644577.
Nagamatsu, S., Ono, M., Kera, S., Okudaira, K. K., Fujikawa, T., & Ueno, N. Multiple Scattering Approach to Polarization Dependence of F K-Edge XANES Spectra for Highly Oriented Polytetrafluoroethylene (PTFE) Thin Film. United States. doi:10.1063/1.2644577.
Nagamatsu, S., Ono, M., Kera, S., Okudaira, K. K., Fujikawa, T., and Ueno, N. Fri . "Multiple Scattering Approach to Polarization Dependence of F K-Edge XANES Spectra for Highly Oriented Polytetrafluoroethylene (PTFE) Thin Film". United States. doi:10.1063/1.2644577.
@article{osti_21054669,
title = {Multiple Scattering Approach to Polarization Dependence of F K-Edge XANES Spectra for Highly Oriented Polytetrafluoroethylene (PTFE) Thin Film},
author = {Nagamatsu, S. and Ono, M. and Kera, S. and Okudaira, K. K. and Fujikawa, T. and Ueno, N.},
abstractNote = {The polarization dependence of F K-edge X-ray absorption near edge structure (XANES) spectra of highly-oriented thin-film of polytetrafluoroethylene (PTFE) has been analyzed by using multiple scattering theory. The spectra show clear polarization dependence due to the highly-oriented structure. The multiple scattering calculations reflects a local structure around an absorbing atom. The calculated results obtained by considering intermolecular-interactions are in good agreement with the observed polarization-dependence. We have also analyzed structural models of the radiation damaged PTFE films.},
doi = {10.1063/1.2644577},
journal = {AIP Conference Proceedings},
number = 1,
volume = 882,
place = {United States},
year = {Fri Feb 02 00:00:00 EST 2007},
month = {Fri Feb 02 00:00:00 EST 2007}
}
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