EXAFS and XRD Studies with Subpicometer Accuracy: The Case of ReO3
- Dipartimento di Fisica, Universita di Trento, I-38050, Povo (Trento) (Italy)
- Institute of Solid State Physics, University of Latvia, LV-1063 Riga (Latvia)
- European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble (France)
- Istituto di Fotonica e Nanotecnologie del CNR, I-38050, Povo (Trento) (Italy)
EXAFS has been measured on ReO3 from 30 to 600 K; XRD has been contemporarily measured above 300 K. In this way, it has been possible to compare the expansion of the lattice parameter (XRD) and of the bond lengths (EXAFS), measured at the same time. EXAFS was interpreted by the cumulant approach, using ReO3 measured at low temperature as reference. According to our results, ReO3 shows a complicated behavior of thermal expansion: (i) ultra low or negative expansion below 100 K, (ii) moderate positive expansion above 150 K up to 500 K, (iii) negative expansion from 500K. up to the decomposition temperature. The EXAFS parallel and perpendicular MSRD (mean square relative displacements) have been calculated for the 1st and 4th shells. An unexpected result is that the perpendicular MSRD of the first coordination shell has a weak temperature dependence.
- OSTI ID:
- 21054644
- Journal Information:
- AIP Conference Proceedings, Vol. 882, Issue 1; Conference: XAFS13: 13. international conference on X-ray absorption fine structure, Stanford, CA (United States), 9-14 Jul 2006; Other Information: DOI: 10.1063/1.2644546; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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