skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Microspectroscopy Beamline at the Australian Synchrotron

Abstract

This dedicated beamline will provide sub-micron spatial resolution with the highest flux possible and an energy tuning range of 4.7-25 keV using an in-vacuum undulator source. It will combine 2D mapping with {mu}-XRF, {mu}-XANES and {mu}-XAFS for elemental and chemical analysis to solve scientific problems that can only be understood using sub-micron resolutions. The primary beamline design goal is to achieve sub-micron spatial resolution, 100-200 nm, at energy resolutions approaching 1/10000. This spatial resolution will be achieved without a major compromise to the flux, as the beamline will simultaneously achieve detection sensitivities to sub-ppm levels. The beamline will have the flexibility to trade-off one parameter against gains in certain attributes, as dictated by the needs of the application. Fresnel zone plates are intended for the highest resolution applications, while the KB mirrors are shall be used for applications where achromatic focusing and high sensitivity are required. The beamline design will accommodate a diverse range of applications with greatly contrasting sample formats, sample composition and anticipated detector count rates.

Authors:
;  [1];  [2];  [3];  [4]
  1. Australian Synchrotron, Clayton VIC (Australia)
  2. ANSTO, Menai NSW (Australia)
  3. CSIRO Exploration and Mining, Clayton VIC (Australia)
  4. (Australia)
Publication Date:
OSTI Identifier:
21052655
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436197; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; ABSORPTION SPECTROSCOPY; BEAM PRODUCTION; COUNTING RATES; DESIGN; ENERGY RESOLUTION; FINE STRUCTURE; FOCUSING; GAIN; KEV RANGE; MIRRORS; PHOTON BEAMS; SENSITIVITY; SPATIAL RESOLUTION; SYNCHROTRON RADIATION; WIGGLER MAGNETS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY

Citation Formats

Paterson, D. J., Boldeman, J. W., Cohen, D. D., Ryan, C. G., and Physics Department, University of Melbourne, Parkville VIC. Microspectroscopy Beamline at the Australian Synchrotron. United States: N. p., 2007. Web. doi:10.1063/1.2436197.
Paterson, D. J., Boldeman, J. W., Cohen, D. D., Ryan, C. G., & Physics Department, University of Melbourne, Parkville VIC. Microspectroscopy Beamline at the Australian Synchrotron. United States. doi:10.1063/1.2436197.
Paterson, D. J., Boldeman, J. W., Cohen, D. D., Ryan, C. G., and Physics Department, University of Melbourne, Parkville VIC. Fri . "Microspectroscopy Beamline at the Australian Synchrotron". United States. doi:10.1063/1.2436197.
@article{osti_21052655,
title = {Microspectroscopy Beamline at the Australian Synchrotron},
author = {Paterson, D. J. and Boldeman, J. W. and Cohen, D. D. and Ryan, C. G. and Physics Department, University of Melbourne, Parkville VIC},
abstractNote = {This dedicated beamline will provide sub-micron spatial resolution with the highest flux possible and an energy tuning range of 4.7-25 keV using an in-vacuum undulator source. It will combine 2D mapping with {mu}-XRF, {mu}-XANES and {mu}-XAFS for elemental and chemical analysis to solve scientific problems that can only be understood using sub-micron resolutions. The primary beamline design goal is to achieve sub-micron spatial resolution, 100-200 nm, at energy resolutions approaching 1/10000. This spatial resolution will be achieved without a major compromise to the flux, as the beamline will simultaneously achieve detection sensitivities to sub-ppm levels. The beamline will have the flexibility to trade-off one parameter against gains in certain attributes, as dictated by the needs of the application. Fresnel zone plates are intended for the highest resolution applications, while the KB mirrors are shall be used for applications where achromatic focusing and high sensitivity are required. The beamline design will accommodate a diverse range of applications with greatly contrasting sample formats, sample composition and anticipated detector count rates.},
doi = {10.1063/1.2436197},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}