skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Wiggler-base Hard X-ray Spectroscopy Beamline at CLS

Abstract

The CLS 06ID-1 Hard X-ray Micro-Analysis Beamline (HXMA) is a general purpose hard X-ray spectroscopy beamline (5 to 40 keV) designed to serve users in XAFS, diffraction and microprobe communities. The beamline uses the synchrotron radiation from a superconducting wiggler. The primary beamline optics include a 1.2 m water-cooled silicon collimating mirror (separate Rh and Pt coating stripes), a liquid nitrogen cooled double crystal monochromator (Kohzu CMJ-1) housing two crystal pairs (Si 111 and 220), and a 1.15 m long water-cooled silicon toroidal focusing mirror (separate Rh and Pt coating stripes). All mirrors are equipped with dynamical meridian benders. The experimental hutch hosts three experimental setups for XAFS, diffraction and microprobe, respectively. Primary design considerations and some commissioning results are discussed.

Authors:
 [1];  [2];  [1];  [2];  [1]
  1. Canadian Light Source, University of Saskatchewan, Saskatoon, SK (Canada)
  2. (Canada)
Publication Date:
OSTI Identifier:
21052638
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436181; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; ABSORPTION SPECTROSCOPY; BEAM OPTICS; COMMISSIONING; CRYSTALS; DESIGN; FINE STRUCTURE; FOCUSING; HARD X RADIATION; KEV RANGE; MIRRORS; MONOCHROMATORS; PHOTON BEAMS; SILICON; SUPERCONDUCTING MAGNETS; SYNCHROTRON RADIATION; X-RAY SPECTROSCOPY

Citation Formats

Jiang, D. T., Department of Physics, University of Guelph, Guelph ON N1G 2W1, Chen, N., Geological Sciences Department, University of Saskachewan, Saskatoon, SK, and Sheng, W. Wiggler-base Hard X-ray Spectroscopy Beamline at CLS. United States: N. p., 2007. Web. doi:10.1063/1.2436181.
Jiang, D. T., Department of Physics, University of Guelph, Guelph ON N1G 2W1, Chen, N., Geological Sciences Department, University of Saskachewan, Saskatoon, SK, & Sheng, W. Wiggler-base Hard X-ray Spectroscopy Beamline at CLS. United States. doi:10.1063/1.2436181.
Jiang, D. T., Department of Physics, University of Guelph, Guelph ON N1G 2W1, Chen, N., Geological Sciences Department, University of Saskachewan, Saskatoon, SK, and Sheng, W. Fri . "Wiggler-base Hard X-ray Spectroscopy Beamline at CLS". United States. doi:10.1063/1.2436181.
@article{osti_21052638,
title = {Wiggler-base Hard X-ray Spectroscopy Beamline at CLS},
author = {Jiang, D. T. and Department of Physics, University of Guelph, Guelph ON N1G 2W1 and Chen, N. and Geological Sciences Department, University of Saskachewan, Saskatoon, SK and Sheng, W.},
abstractNote = {The CLS 06ID-1 Hard X-ray Micro-Analysis Beamline (HXMA) is a general purpose hard X-ray spectroscopy beamline (5 to 40 keV) designed to serve users in XAFS, diffraction and microprobe communities. The beamline uses the synchrotron radiation from a superconducting wiggler. The primary beamline optics include a 1.2 m water-cooled silicon collimating mirror (separate Rh and Pt coating stripes), a liquid nitrogen cooled double crystal monochromator (Kohzu CMJ-1) housing two crystal pairs (Si 111 and 220), and a 1.15 m long water-cooled silicon toroidal focusing mirror (separate Rh and Pt coating stripes). All mirrors are equipped with dynamical meridian benders. The experimental hutch hosts three experimental setups for XAFS, diffraction and microprobe, respectively. Primary design considerations and some commissioning results are discussed.},
doi = {10.1063/1.2436181},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}
  • Hard X-ray photoelectron spectroscopy (HAXPES) is a powerful tool for investigating the chemical and electronic states of bulk and buried interface in a non-destructive manner due to the large probing depth of this technique. At BL46XU of SPring-8, there are two HAXPES systems equipped with different electron spectrometers, which can be utilized appropriately according to the purpose in various industrial researches. In this article, these systems are outlined, and two typical examples of HAXPES studies performed by them are presented, which focus on the silicidation at Ni/SiC interface and the energy distribution of interface states at SiO{sub 2}/a-InGaZnO.
  • We have developed a high resolution monochromatic x-ray computed tomography system using synchrotron radiation in the energy range up to 50 keV. The system was installed in a vertical wiggler beamline (BL14C) at the Photon Factory of the National Laboratory for High Energy Physics, and consists of a double-crystal monochromator employing asymmetric Bragg reflections, a photodiode array detector with a phosphor screen, and a microcomputer for control. Computed tomography (CT) images with a pixel size of 6 to 8 {mu}m and with a slice width ranging from 20 to 100 {mu}m were obtained. An image subtraction technique for CT imagesmore » above and below the x-ray absorption edge of iodine was also evaluated for liquid-containing glass capillaries. Since the CT value (pixel weighting) is linearly proportional to the concentration, the system can quantitatively evaluate the concentration distribution of iodine. These results indicate that the system is very useful for nondestructively evaluating fine structures and their constituent elements.« less
  • A soft x-ray beamline, utilizing the radiation produced by the six-pole wiggler of the Adone storage ring, has been realized. The beamline allows the exposure of large area resists by means of a double-mirror scanning system or mechanically moving the wafer. The mechanical, geometrical, and spectral characteristics of the beamline will be described.
  • We present an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor (HASYLAB) to grazing incidence wide angle x-ray scattering (GIWAXS). GIWAXS refers to an x-ray diffraction method, which, based on the measurement geometry, is perfectly suited for the investigation of the material crystallinity of surfaces and thin films. It is shown that the overall experimental GIWAXS setup employing a movable CCD-detector provides the capability of reliable and reproducible diffraction measurements in grazing incidence geometry. Furthermore, the potential usage of an additional detector enables the simultaneous or successive measurement of GIWAXS and grazing incidencemore » small angle x-ray scattering (GISAXS). The new capability is illustrated by the microbeam GIWAXS measurement of a thin film of the conjugated polymer poly(3-octylthiophene) (P3OT). The investigation reveals the semicrystalline nature of the P3OT film by a clear identification of the wide angle scattering reflexes up to the third order in the [100]-direction as well as the first order in the [010]-direction. The corresponding microbeam GISAXS measurement on the present morphology complements the characterization yielding the complete sample informa-tion from subnanometer up to micrometer length scales.« less
  • The hard x-ray wiggler (W2) at the storage ring DORIS can provide very high power densities to beamline components.