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Title: A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer

Abstract

A VUV Fourier transform spectrometer based on a wavefront division interferometer has been built. Our ultimate goal is to provide a high resolution absorption spectrometer in the 140 - 40 nm range using the new third generation French synchrotron source Soleil as the background continuum. Here, we present the design and latest performance of the instrument scanning control system. It is based on multiple reflections of a monomode, frequency-stabilized HeNe laser between two plane mirrors allowing the required sensitivity on the displacement of the interferometer mobile arm. The experimental results on the sampling precision show an rms error below 5 nm for a travel length of 7.5 mm.

Authors:
; ;  [1]; ; ;  [2];  [3]
  1. Synchrotron Soleil-Orme des Merisiers St Aubin BP48 -91192 Gif sur Yvette (France)
  2. Laboratoire Charles Fabry de l'Institut d'Optique, bat. 503, F91403 Orsay (France)
  3. Laboratoire de Photophysique Moleculaire, bat. 350, F91403 Orsay (France)
Publication Date:
OSTI Identifier:
21052550
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436095; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ACCURACY; CONTROL SYSTEMS; DESIGN; FAR ULTRAVIOLET RADIATION; FOURIER TRANSFORM SPECTROMETERS; HELIUM-NEON LASERS; LASER RADIATION; MIRRORS; PERFORMANCE; REFLECTION; RESOLUTION; SAMPLING; SENSITIVITY; SYNCHROTRON RADIATION; SYNCHROTRON RADIATION SOURCES

Citation Formats

De Oliveira, N., Nahon, L., Polack, F., Joyeux, D., Phalippou, D., Rodier, J. C., and Vervloeet, M. A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer. United States: N. p., 2007. Web. doi:10.1063/1.2436095.
De Oliveira, N., Nahon, L., Polack, F., Joyeux, D., Phalippou, D., Rodier, J. C., & Vervloeet, M. A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer. United States. doi:10.1063/1.2436095.
De Oliveira, N., Nahon, L., Polack, F., Joyeux, D., Phalippou, D., Rodier, J. C., and Vervloeet, M. Fri . "A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer". United States. doi:10.1063/1.2436095.
@article{osti_21052550,
title = {A High Precision Scanning Control System For A VUV Fourier Transform Spectrometer},
author = {De Oliveira, N. and Nahon, L. and Polack, F. and Joyeux, D. and Phalippou, D. and Rodier, J. C. and Vervloeet, M.},
abstractNote = {A VUV Fourier transform spectrometer based on a wavefront division interferometer has been built. Our ultimate goal is to provide a high resolution absorption spectrometer in the 140 - 40 nm range using the new third generation French synchrotron source Soleil as the background continuum. Here, we present the design and latest performance of the instrument scanning control system. It is based on multiple reflections of a monomode, frequency-stabilized HeNe laser between two plane mirrors allowing the required sensitivity on the displacement of the interferometer mobile arm. The experimental results on the sampling precision show an rms error below 5 nm for a travel length of 7.5 mm.},
doi = {10.1063/1.2436095},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}
  • The construction and the performance of a double pass rapid scanning Fourier transform spectrometer are described. The instrument covers a frequency range below 900 GHz. It has a maximum spectral resolution of 6.6 GHz and a maximum time resolution of 10 msec. The spectrometer has been applied to JIPP T-II device at Institute of Plasma Physics in Nagoya University. Electron cyclotron emission from the device has been measured and the electron temperature of the plasma has been obtained. The results are shown.
  • Electron cyclotron emission spectra are routinely measured in the FTU tokamak by means of a fast scanning Fourier transform spectrometer. The key element of this instrument is a two-beam interferometer in which the path difference is varied linearly in time by rotation of a helicoidal reflector. The shortest scan time obtained for a path difference excursion of 4 cm was 1.2 ms. The spectrometer has been absolutely calibrated and the measured temperature profiles are in good agreement with those derived from other diagnostics. {copyright} {ital 1995} {ital American} {ital Institute} {ital of} {ital Physics}.
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