skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: New HMI hard X-ray Diffraction Beamlines at BESSY

Abstract

Since April 2005 the Hahn-Meitner-Institute is operating two new beamlines for energy dispersive diffraction experiments (EDDI) and for (resonant) magnetic scattering (MAGS) at BESSY. The source for both beamlines is a superconducting 7 T multipole wiggler which provides hard X-ray photons with energies between 4 and 150 keV. The EDDI beamline uses the white beam and is intended for residual stress measurements on small samples as well as heavy engineering parts. The MAGS beamline delivers a focussed monochromatic beam with photon fluxes in the 1012 (s 100 mA 0.1 % bandwidth)-1 range at energies from 4 to 30 keV. It is equipped for single crystal diffraction and resonant (magnetic) scattering experiments as well as for the study of thin films, micro-, and nanostructures in materials science.

Authors:
; ; ; ; ;  [1]
  1. Hahn-Meitner-Institut Berlin c/o BESSY, Bereich Strukturforschung, Albert-Einstein-Strasse 15, 12489 Berlin (Germany)
Publication Date:
OSTI Identifier:
21049350
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436410; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BEAM PRODUCTION; BESSY STORAGE RING; HARD X RADIATION; KEV RANGE; MICROSTRUCTURE; MONOCHROMATIC RADIATION; MONOCRYSTALS; NANOSTRUCTURES; PHOTONS; RESIDUAL STRESSES; THIN FILMS; X-RAY DIFFRACTION

Citation Formats

Denks, I. A., Genzel, C., Dudzik, E., Feyerherm, R., Klaus, M., and Wagener, G.. New HMI hard X-ray Diffraction Beamlines at BESSY. United States: N. p., 2007. Web. doi:10.1063/1.2436410.
Denks, I. A., Genzel, C., Dudzik, E., Feyerherm, R., Klaus, M., & Wagener, G.. New HMI hard X-ray Diffraction Beamlines at BESSY. United States. doi:10.1063/1.2436410.
Denks, I. A., Genzel, C., Dudzik, E., Feyerherm, R., Klaus, M., and Wagener, G.. Fri . "New HMI hard X-ray Diffraction Beamlines at BESSY". United States. doi:10.1063/1.2436410.
@article{osti_21049350,
title = {New HMI hard X-ray Diffraction Beamlines at BESSY},
author = {Denks, I. A. and Genzel, C. and Dudzik, E. and Feyerherm, R. and Klaus, M. and Wagener, G.},
abstractNote = {Since April 2005 the Hahn-Meitner-Institute is operating two new beamlines for energy dispersive diffraction experiments (EDDI) and for (resonant) magnetic scattering (MAGS) at BESSY. The source for both beamlines is a superconducting 7 T multipole wiggler which provides hard X-ray photons with energies between 4 and 150 keV. The EDDI beamline uses the white beam and is intended for residual stress measurements on small samples as well as heavy engineering parts. The MAGS beamline delivers a focussed monochromatic beam with photon fluxes in the 1012 (s 100 mA 0.1 % bandwidth)-1 range at energies from 4 to 30 keV. It is equipped for single crystal diffraction and resonant (magnetic) scattering experiments as well as for the study of thin films, micro-, and nanostructures in materials science.},
doi = {10.1063/1.2436410},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}
  • The Nanometer Optical Component measuring Machine (NOM) has been developed at BESSY for the purpose of measuring the surface figure of optical components up to 1.2 m in length used at grazing incidence in Synchrotron Radiation beamlines. It is possible to acquire information about slope and height deviations and the radius of curvature of a sample in the form of line-scans and in a three dimensional display format. With the NOM surfaces up to 600 cm2 have been measured with an estimated measuring uncertainty in the range of 0.01 arcsec rms and with a correspondingly high reproducibility. This is amore » five to tenfold improvement compared to the present state of the art of surface measuring techniques. The engineering conception, the design of the NOM and the first measurements are discussed in detail.« less
  • A novel type of ultra-high vacuum instrument for X-ray reflectometry and spectrometry-related techniques for nanoanalytics by means of synchrotron radiation (SR) has been constructed and commissioned at BESSY II. This versa-tile instrument was developed by the PTB, Germany’s national metrology institute, and includes a 9-axis manipulator that allows for an independent alignment of the samples with respect to all degrees of freedom. In addition, it integrates a rotational and translational movement of several photodiodes as well as a translational movement of a beam-geometry-defining aperture system. Thus, the new instrument enables various analytical techniques based on energy dispersive X-ray detectors suchmore » as reference-free X-Ray Fluorescence (XRF) analysis, total-reflection XRF, grazing-incidence XRF, in addition to optional X-Ray Reflectometry (XRR) measurements or polarization-dependent X-ray absorption fine structure analyses (XAFS). Samples having a size of up to (100 × 100) mm{sup 2}; can be analyzed with respect to their mass deposition, elemental, spatial or species composition. Surface contamination, nanolayer composition and thickness, depth pro-file of matrix elements or implants, nanoparticles or buried interfaces as well as molecular orientation of bonds can be accessed. Three technology transfer projects of adapted instruments have enhanced X-Ray Spectrometry (XRS) research activities within Europe at the synchrotron radiation facilities ELETTRA (IAEA) and SOLEIL (CEA/LNE-LNHB) as well as at the X-ray innovation laboratory BLiX (TU Berlin) where different laboratory sources are used. Here, smaller chamber requirements led PTB in cooperation with TU Berlin to develop a modified instrument equipped with a 7-axis manipulator: reduced freedom in the choice of experimental geometry modifications (absence of out-of-SR-plane and reference-free XRS options) has been compensated by encoder-enhanced angular accuracy for GIXRF and XRR.« less
  • Hard x-ray range synchrotron radiation still remains only partially coherent even for ultra-low emittance third-generation sources, such as NSLS-II. On the other hand, many of the scientific goals targeted by new advanced hard x-ray microscopy beamlines--e.g. development of scanning microscopy with nanometer-scale spatial resolution or coherent diffraction imaging microscopy--require high degree of transverse coherence and high radiation flux at a sample. Detailed quantitative prediction of partially-coherent x-ray beam properties at propagation from an undulator, along a beamline with a number of optical elements, can only be obtained from accurate physical-optics based numerical simulations. We present an example of such simulationsmore » performed for the NSLS-II Hard x-ray Nanoprobe beamline using ''Synchrotron Radiation Workshop''(SRW) computer code. In addition to tracking of intensity distributions at different locations of the beamline, we include numerical experiments with a two-slit interference scheme into our analysis, in order to characterize transverse coherence of the resulting wavefront. The wavefront propagation method which has been used offers high flexibility in the beamline optimization, allowing to choose optical element parameters for different types of microscopy experiments.« less
  • We designed and installed two types of long-working-distance Kirkpatrick-Baez (KB) mirrors and mirror manipulators, which were customized into each experiment for hard x-ray undulator beamlines at SPring-8. For the BL32XU RIKEN Targeted Proteins beamline, 400-mm-long KB focusing mirrors for a beam size of 1 {mu}m with a 730-mm-long working distance were designed for carrying out the structural analysis of protein microcrystals. We realized a focusing beam size of 0.9x0.9 {mu}m{sup 2}(FWHM) and a focusing intensity of 6x10{sup 10} (photons/s) at an x-ray energy of 12.4 keV. For the BL19LXU RIKEN SR Physics beamline, we developed KB mirrors for 100-nm focusingmore » with a 100-mm-working distance for the purpose of nano-focus x-ray diffraction. A focusing beam size of 100x100 nm{sup 2}(FWHM) and a high focusing intensity of 3.7x10{sup 10} (photons/s) at an x-ray energy of 12.4 keV were realized.« less