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Title: Anomalous X-Ray Scattering Using Third-Generation Synchrotron Radiation

Abstract

In this paper, we discuss the recent development of anomalous X-ray scattering (AXS) technique as a tool of investigating local structures of non-crystalline materials using a third-generation synchrotron radiation facility, ESRF. In order to obtain differential structure factors with a high statistical quality, it is necessary to acquire scattering data with a good energy resolution to discriminate elastic signals from fluorescence and Compton scattering intensities, as well as with a sufficient number of scattered X-ray photons. For this we chose a single-crystal graphite energy-analyzer with a long detector arm. In order to show the feasibility of this detecting system, we describe in detail examples of our recent AXS results on As2Se3 chalcogenide glass and (As2Se3)0.4(AgI)0.6 superionic glass.

Authors:
 [1];  [2]
  1. Center for Materials Research Using Third-Generation Synchrotron Radiation Facilities, Hiroshima Institute of Technology, Hiroshima 731-5193 (Japan) and Institut fuer Physikalische-, Kern-, und Makromolekulare Chemie, Philipps Universitaet Marburg, D-35032 Marburg (Gemany)
  2. Laboratoire de Cristallographie, CNRS, F-38042 Grenoble Cedex (France)
Publication Date:
OSTI Identifier:
21049344
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436405; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ARSENIC SELENIDES; COMPTON EFFECT; ENERGY RESOLUTION; EUROPEAN SYNCHROTRON RADIATION FACILITY; FLUORESCENCE; GLASS; GRAPHITE; MONOCRYSTALS; SILVER IODIDES; STRUCTURE FACTORS; SYNCHROTRON RADIATION; X-RAY DIFFRACTION

Citation Formats

Hosokawa, S., and Berar, J.-F.. Anomalous X-Ray Scattering Using Third-Generation Synchrotron Radiation. United States: N. p., 2007. Web. doi:10.1063/1.2436405.
Hosokawa, S., & Berar, J.-F.. Anomalous X-Ray Scattering Using Third-Generation Synchrotron Radiation. United States. doi:10.1063/1.2436405.
Hosokawa, S., and Berar, J.-F.. Fri . "Anomalous X-Ray Scattering Using Third-Generation Synchrotron Radiation". United States. doi:10.1063/1.2436405.
@article{osti_21049344,
title = {Anomalous X-Ray Scattering Using Third-Generation Synchrotron Radiation},
author = {Hosokawa, S. and Berar, J.-F.},
abstractNote = {In this paper, we discuss the recent development of anomalous X-ray scattering (AXS) technique as a tool of investigating local structures of non-crystalline materials using a third-generation synchrotron radiation facility, ESRF. In order to obtain differential structure factors with a high statistical quality, it is necessary to acquire scattering data with a good energy resolution to discriminate elastic signals from fluorescence and Compton scattering intensities, as well as with a sufficient number of scattered X-ray photons. For this we chose a single-crystal graphite energy-analyzer with a long detector arm. In order to show the feasibility of this detecting system, we describe in detail examples of our recent AXS results on As2Se3 chalcogenide glass and (As2Se3)0.4(AgI)0.6 superionic glass.},
doi = {10.1063/1.2436405},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}
  • Applications of x-ray magnetic circular dichroism (XMCD) to the study of magnetic materials are described. XMCD spectra can be used to quantitatively determine magnetic properties on an element-specific basis. These spectra are also sensitive to the chemical state and environment of the element being probed. The dichroism effect can also be used to produce images of microscopic magnetic structures and domains. Third generation synchrotron light sources are well suited to these experiments. Current and planned facilities at the Advanced Light Source, the first of the new light sources in the U.S., are described, focusing on a new facility with specializedmore » undulators which will directly produce high flux, high brightness beams of circularly polarized x-rays. With new beamlines which have been optimized for either spectroscopy or microscopy, this facility will provide the capability to provide detailed information about magnetic materials. {copyright} {ital 1996 American Vacuum Society}« less
  • No abstract prepared.
  • The third-generation, high-brilliance, synchrotron radiation sources currently under construction will usher in a new era of x-ray research in the physical, chemical, and biological sciences. One of the most exciting areas of experimentation will be the extension of static x-ray scattering and diffraction techniques to the study of transient or time-evolving systems. The high repetition rate, short-pulse duration, high-brilliance, variable spectral bandwidth, and large particle beam energies of these sources make them ideal for hard x-ray, time-resolved studies. The primary focus of this presentation will be on the novel instrumentation required for time-resolved studies such as optics which can increasemore » the flux on the sample or disperse the x-ray beam, detectors and electronics for parallel data collection, and methods for altering the natural time structure of the radiation. This work is supported by the U.S. Department of Energy, BES-Materials Science, under Contract No. W-31-109-ENG-38.« less
  • An apparatus and technique are described for the characterization and energy stabilization of a monochromatic x-ray beam from a synchrotron radiation source that is used for diffraction experiments. The energy of the beam between 6{endash}30 keV can be absolutely measured to an accuracy of 0.3 eV and continuous stability can be guaranteed to 0.2 eV for the duration of an experiment. The particular case of multiple wavelength anomalous diffraction is considered in detail. {copyright} {ital 1996 American Institute of Physics.}