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Title: Anomalous X-Ray Scattering Using Third-Generation Synchrotron Radiation

Abstract

In this paper, we discuss the recent development of anomalous X-ray scattering (AXS) technique as a tool of investigating local structures of non-crystalline materials using a third-generation synchrotron radiation facility, ESRF. In order to obtain differential structure factors with a high statistical quality, it is necessary to acquire scattering data with a good energy resolution to discriminate elastic signals from fluorescence and Compton scattering intensities, as well as with a sufficient number of scattered X-ray photons. For this we chose a single-crystal graphite energy-analyzer with a long detector arm. In order to show the feasibility of this detecting system, we describe in detail examples of our recent AXS results on As2Se3 chalcogenide glass and (As2Se3)0.4(AgI)0.6 superionic glass.

Authors:
 [1];  [2]
  1. Center for Materials Research Using Third-Generation Synchrotron Radiation Facilities, Hiroshima Institute of Technology, Hiroshima 731-5193 (Japan) and Institut fuer Physikalische-, Kern-, und Makromolekulare Chemie, Philipps Universitaet Marburg, D-35032 Marburg (Gemany)
  2. Laboratoire de Cristallographie, CNRS, F-38042 Grenoble Cedex (France)
Publication Date:
OSTI Identifier:
21049344
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436405; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ARSENIC SELENIDES; COMPTON EFFECT; ENERGY RESOLUTION; EUROPEAN SYNCHROTRON RADIATION FACILITY; FLUORESCENCE; GLASS; GRAPHITE; MONOCRYSTALS; SILVER IODIDES; STRUCTURE FACTORS; SYNCHROTRON RADIATION; X-RAY DIFFRACTION

Citation Formats

Hosokawa, S., and Berar, J.-F.. Anomalous X-Ray Scattering Using Third-Generation Synchrotron Radiation. United States: N. p., 2007. Web. doi:10.1063/1.2436405.
Hosokawa, S., & Berar, J.-F.. Anomalous X-Ray Scattering Using Third-Generation Synchrotron Radiation. United States. doi:10.1063/1.2436405.
Hosokawa, S., and Berar, J.-F.. Fri . "Anomalous X-Ray Scattering Using Third-Generation Synchrotron Radiation". United States. doi:10.1063/1.2436405.
@article{osti_21049344,
title = {Anomalous X-Ray Scattering Using Third-Generation Synchrotron Radiation},
author = {Hosokawa, S. and Berar, J.-F.},
abstractNote = {In this paper, we discuss the recent development of anomalous X-ray scattering (AXS) technique as a tool of investigating local structures of non-crystalline materials using a third-generation synchrotron radiation facility, ESRF. In order to obtain differential structure factors with a high statistical quality, it is necessary to acquire scattering data with a good energy resolution to discriminate elastic signals from fluorescence and Compton scattering intensities, as well as with a sufficient number of scattered X-ray photons. For this we chose a single-crystal graphite energy-analyzer with a long detector arm. In order to show the feasibility of this detecting system, we describe in detail examples of our recent AXS results on As2Se3 chalcogenide glass and (As2Se3)0.4(AgI)0.6 superionic glass.},
doi = {10.1063/1.2436405},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}