Developing a Dedicated GISAXS Beamline at the APS
- X-Ray Science Division, Argonne National Laboratory, 9700 S. Cass Ave., Argonne, IL 60439 (United States)
As an increasingly important structural-characterization technique, grazing-incidence small-angle scattering (GISAXS) finds vast applications in nanostructures and nanocomposites at surfaces and interfaces for in situ and real-time studies because of its probing q-range (10{sup -3} - 1 nm{sup -1}) and temporal resolution (10{sup -3} - 1 s). At the Advanced Photon Source (APS), GISAXS techniques under thin-film waveguide-based resonance conditions were developed to study the diffusion phenomena in nanoparticle/polymer nanocomposites. Also, the kinematics of nanoparticle crystal formation at air/liquid interfaces has been obtained by the similar method in real time during the liquid droplet evaporation. To meet the strong demand from the nanoscience community, a dedicated GISAXS beamline has been designed and constructed as a part of the 8-ID-E beamline at the APS. This dedicated GISAXS setup was developed based on a 4-circle diffractometer so that precise reflectivity of the sample can be measured to complement the GISAXS analysis under the dynamical refection conditions.
- OSTI ID:
- 21049286
- Journal Information:
- AIP Conference Proceedings, Vol. 879, Issue 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436323; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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