skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Developing a Dedicated GISAXS Beamline at the APS

Abstract

As an increasingly important structural-characterization technique, grazing-incidence small-angle scattering (GISAXS) finds vast applications in nanostructures and nanocomposites at surfaces and interfaces for in situ and real-time studies because of its probing q-range (10{sup -3} - 1 nm{sup -1}) and temporal resolution (10{sup -3} - 1 s). At the Advanced Photon Source (APS), GISAXS techniques under thin-film waveguide-based resonance conditions were developed to study the diffusion phenomena in nanoparticle/polymer nanocomposites. Also, the kinematics of nanoparticle crystal formation at air/liquid interfaces has been obtained by the similar method in real time during the liquid droplet evaporation. To meet the strong demand from the nanoscience community, a dedicated GISAXS beamline has been designed and constructed as a part of the 8-ID-E beamline at the APS. This dedicated GISAXS setup was developed based on a 4-circle diffractometer so that precise reflectivity of the sample can be measured to complement the GISAXS analysis under the dynamical refection conditions.

Authors:
; ; ; ; ;  [1]
  1. X-Ray Science Division, Argonne National Laboratory, 9700 S. Cass Ave., Argonne, IL 60439 (United States)
Publication Date:
OSTI Identifier:
21049286
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436323; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ADVANCED PHOTON SOURCE; COMPOSITE MATERIALS; CRYSTALS; DIFFUSION; INTERFACES; LIQUIDS; NANOSTRUCTURES; OPTICS; POLYMERS; REFLECTIVITY; RESOLUTION; SMALL ANGLE SCATTERING; SURFACES; THIN FILMS; WAVEGUIDES; X RADIATION; X-RAY DIFFRACTION

Citation Formats

Li Xuefa, Narayanan, Suresh, Sprung, Michael, Sandy, Alec, Lee, Dong Ryeol, and Wang, Jin. Developing a Dedicated GISAXS Beamline at the APS. United States: N. p., 2007. Web. doi:10.1063/1.2436323.
Li Xuefa, Narayanan, Suresh, Sprung, Michael, Sandy, Alec, Lee, Dong Ryeol, & Wang, Jin. Developing a Dedicated GISAXS Beamline at the APS. United States. doi:10.1063/1.2436323.
Li Xuefa, Narayanan, Suresh, Sprung, Michael, Sandy, Alec, Lee, Dong Ryeol, and Wang, Jin. Fri . "Developing a Dedicated GISAXS Beamline at the APS". United States. doi:10.1063/1.2436323.
@article{osti_21049286,
title = {Developing a Dedicated GISAXS Beamline at the APS},
author = {Li Xuefa and Narayanan, Suresh and Sprung, Michael and Sandy, Alec and Lee, Dong Ryeol and Wang, Jin},
abstractNote = {As an increasingly important structural-characterization technique, grazing-incidence small-angle scattering (GISAXS) finds vast applications in nanostructures and nanocomposites at surfaces and interfaces for in situ and real-time studies because of its probing q-range (10{sup -3} - 1 nm{sup -1}) and temporal resolution (10{sup -3} - 1 s). At the Advanced Photon Source (APS), GISAXS techniques under thin-film waveguide-based resonance conditions were developed to study the diffusion phenomena in nanoparticle/polymer nanocomposites. Also, the kinematics of nanoparticle crystal formation at air/liquid interfaces has been obtained by the similar method in real time during the liquid droplet evaporation. To meet the strong demand from the nanoscience community, a dedicated GISAXS beamline has been designed and constructed as a part of the 8-ID-E beamline at the APS. This dedicated GISAXS setup was developed based on a 4-circle diffractometer so that precise reflectivity of the sample can be measured to complement the GISAXS analysis under the dynamical refection conditions.},
doi = {10.1063/1.2436323},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}
  • As an increasingly important structural-characterization technique, grazing-incidence small-angle scattering (GISAXS) finds vast applications in nanostructures and nanocomposites at surfaces and interfaces for in situ and real-time studies because of its probing q-range (10{sup -3} - 1 nm{sup -1}) and temporal resolution (10{sup -3} - 1 s). At the Advanced Photon Source (APS), GISAXS techniques under thin-film waveguide-based resonance conditions were developed to study the diffusion phenomena in nanoparticle/polymer nanocomposites. Also, the kinematics of nanoparticle crystal formation at air/liquid interfaces has been obtained by the similar method in real time during the liquid droplet evaporation. To meet the strong demand frommore » the nanoscience community, a dedicated GISAXS beamline has been designed and constructed as a part of the 8-ID-E beamline at the APS. This dedicated GISAXS setup was developed based on a 4-circle diffractometer so that precise reflectivity of the sample can be measured to complement the GISAXS analysis under the dynamical refection conditions.« less
  • A dedicated insertion-device beamline has been designed and is being constructed at the Advanced Photon Source (APS) for development of x-ray microfocusing- and coherence-based techniques and applications. Important parameters considered in this design include preservation of source brilliance and coherence, selectable transverse coherence length and energy bandwidth, high beam angular stability, high order harmonic suppression, quick x-ray energy scan, and accurate and stable x-ray energy. The overall design of this beamline layout and the major beamline components are described. The use of a horizontally deflecting mirror as the first optical component is one of the main features of this beamlinemore » design, and the resulting advantages are briefly discussed. {copyright} {ital 1996 American Institute of Physics.}« less
  • No abstract prepared.
  • A new dedicated high-resolution high-throughput powder diffraction beamline has been built, fully commissioned, and opened to general users at the Advanced Photon Source. The optical design and commissioning results are presented. Beamline performance was examined using a mixture of the NIST Si and Al{sub 2}O{sub 3} standard reference materials, as well as the LaB6 line-shape standard. Instrumental resolution as high as 1.7 x 10{sup -4} ({Delta} Q/Q) was observed.
  • A new facility for microdiffraction strain measurements and microfluorescence mapping has been built on beamline 12.3.2 at the advanced light source of the Lawrence Berkeley National Laboratory. This beamline benefits from the hard x-radiation generated by a 6 T superconducting bending magnet (superbend) This provides a hard x-ray spectrum from 5 to 22 keV and a flux within a 1 mu m spot of ~;;5x109 photons/ s (0.1percent bandwidth at 8 keV). The radiation is relayed from the superbend source to a focus in the experimental hutch by a toroidal mirror. The focus spot is tailored bytwo pairs of adjustablemore » slits, which serve as secondary source point. Inside the lead hutch, a pair of Kirkpatrick-Baez (KB) mirrors placed in a vacuum tank refocuses the secondary slit source onto the sample position. A new KB-bending mechanism with active temperature stabilization allows for more reproducible and stable mirror bending and thus mirror focusing. Focus spots around 1 um are routinely achieved and allow a variety of experiments, which have in common the need of spatial resolution. The effective spatial resolution (~;;0.2 mu m) is limited by a convolution of beam size, scan-stage resolution, and stage stability. A four-bounce monochromator consisting of two channel-cut Si(111) crystals placed between the secondary source and KB-mirrors allows for easy changes between white-beam and monochromatic experiments while maintaining a fixed beam position. High resolution stage scans are performed while recording a fluorescence emission signal or an x-ray diffraction signal coming from either a monochromatic or a white focused beam. The former allows for elemental mapping, whereas the latter is used to produce two-dimensional maps of crystal-phases, -orientation, -texture, and -strain/stress. Typically achieved strain resolution is in the order of 5x10-5 strain units. Accurate sample positioning in the x-ray focus spot is achieved with a commercial laser-triangulation unit. A Si-drift detector serves as a high-energy-resolution (~;;150 eV full width at half maximum) fluorescence detector. Fluorescence scans can be collected in continuous scan mode with up to 300 pixels/s scan speed. A charge coupled device area detector is utilized as diffraction detector. Diffraction can be performed in reflecting or transmitting geometry. Diffraction data are processed using XMAS, an in-house written software package for Laue and monochromatic microdiffraction analysis.« less