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Title: Developing a Dedicated GISAXS Beamline at the APS

Abstract

As an increasingly important structural-characterization technique, grazing-incidence small-angle scattering (GISAXS) finds vast applications in nanostructures and nanocomposites at surfaces and interfaces for in situ and real-time studies because of its probing q-range (10{sup -3} - 1 nm{sup -1}) and temporal resolution (10{sup -3} - 1 s). At the Advanced Photon Source (APS), GISAXS techniques under thin-film waveguide-based resonance conditions were developed to study the diffusion phenomena in nanoparticle/polymer nanocomposites. Also, the kinematics of nanoparticle crystal formation at air/liquid interfaces has been obtained by the similar method in real time during the liquid droplet evaporation. To meet the strong demand from the nanoscience community, a dedicated GISAXS beamline has been designed and constructed as a part of the 8-ID-E beamline at the APS. This dedicated GISAXS setup was developed based on a 4-circle diffractometer so that precise reflectivity of the sample can be measured to complement the GISAXS analysis under the dynamical refection conditions.

Authors:
; ; ; ; ;  [1]
  1. X-Ray Science Division, Argonne National Laboratory, 9700 S. Cass Ave., Argonne, IL 60439 (United States)
Publication Date:
OSTI Identifier:
21049286
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436323; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ADVANCED PHOTON SOURCE; COMPOSITE MATERIALS; CRYSTALS; DIFFUSION; INTERFACES; LIQUIDS; NANOSTRUCTURES; OPTICS; POLYMERS; REFLECTIVITY; RESOLUTION; SMALL ANGLE SCATTERING; SURFACES; THIN FILMS; WAVEGUIDES; X RADIATION; X-RAY DIFFRACTION

Citation Formats

Li Xuefa, Narayanan, Suresh, Sprung, Michael, Sandy, Alec, Lee, Dong Ryeol, and Wang, Jin. Developing a Dedicated GISAXS Beamline at the APS. United States: N. p., 2007. Web. doi:10.1063/1.2436323.
Li Xuefa, Narayanan, Suresh, Sprung, Michael, Sandy, Alec, Lee, Dong Ryeol, & Wang, Jin. Developing a Dedicated GISAXS Beamline at the APS. United States. doi:10.1063/1.2436323.
Li Xuefa, Narayanan, Suresh, Sprung, Michael, Sandy, Alec, Lee, Dong Ryeol, and Wang, Jin. Fri . "Developing a Dedicated GISAXS Beamline at the APS". United States. doi:10.1063/1.2436323.
@article{osti_21049286,
title = {Developing a Dedicated GISAXS Beamline at the APS},
author = {Li Xuefa and Narayanan, Suresh and Sprung, Michael and Sandy, Alec and Lee, Dong Ryeol and Wang, Jin},
abstractNote = {As an increasingly important structural-characterization technique, grazing-incidence small-angle scattering (GISAXS) finds vast applications in nanostructures and nanocomposites at surfaces and interfaces for in situ and real-time studies because of its probing q-range (10{sup -3} - 1 nm{sup -1}) and temporal resolution (10{sup -3} - 1 s). At the Advanced Photon Source (APS), GISAXS techniques under thin-film waveguide-based resonance conditions were developed to study the diffusion phenomena in nanoparticle/polymer nanocomposites. Also, the kinematics of nanoparticle crystal formation at air/liquid interfaces has been obtained by the similar method in real time during the liquid droplet evaporation. To meet the strong demand from the nanoscience community, a dedicated GISAXS beamline has been designed and constructed as a part of the 8-ID-E beamline at the APS. This dedicated GISAXS setup was developed based on a 4-circle diffractometer so that precise reflectivity of the sample can be measured to complement the GISAXS analysis under the dynamical refection conditions.},
doi = {10.1063/1.2436323},
journal = {AIP Conference Proceedings},
number = 1,
volume = 879,
place = {United States},
year = {Fri Jan 19 00:00:00 EST 2007},
month = {Fri Jan 19 00:00:00 EST 2007}
}