skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Evaluation of In-Vacuum Imaging Plate Detector for X-Ray Diffraction Microscopy

Abstract

We performed evaluation tests of a newly developed in-vacuum imaging plate (IP) detector for x-ray diffraction microscopy. IP detectors have advantages over direct x-ray detection charge-coupled device (CCD) detectors, which have been commonly used in x-ray diffraction microscopy experiments, in the capabilities for a high photon count and for a wide area. The detector system contains two IPs to make measurement efficient by recording data with the one while reading or erasing the other. We compared speckled diffraction patterns of single particles taken with the IP and a direct x-ray detection CCD. The IP was inferior to the CCD in spatial resolution and in signal-to-noise ratio at a low photon count.

Authors:
; ; ;  [1]
  1. SPring-8 / RIKEN, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan)
Publication Date:
OSTI Identifier:
21049284
Resource Type:
Journal Article
Journal Name:
AIP Conference Proceedings
Additional Journal Information:
Journal Volume: 879; Journal Issue: 1; Conference: 9. international conference on synchrotron radiation instrumentation, Daegu (Korea, Republic of), 28 May - 2 Jun 2006; Other Information: DOI: 10.1063/1.2436321; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CHARGE-COUPLED DEVICES; IMAGES; MICROSCOPY; PHOTONS; PLATES; SENSORS; SIGNAL-TO-NOISE RATIO; SPATIAL RESOLUTION; X RADIATION; X-RAY DETECTION; X-RAY DIFFRACTION

Citation Formats

Nishino, Yoshinori, Takahashi, Yukio, Yamamoto, Masaki, and Ishikawa, Tetsuya. Evaluation of In-Vacuum Imaging Plate Detector for X-Ray Diffraction Microscopy. United States: N. p., 2007. Web. doi:10.1063/1.2436321.
Nishino, Yoshinori, Takahashi, Yukio, Yamamoto, Masaki, & Ishikawa, Tetsuya. Evaluation of In-Vacuum Imaging Plate Detector for X-Ray Diffraction Microscopy. United States. doi:10.1063/1.2436321.
Nishino, Yoshinori, Takahashi, Yukio, Yamamoto, Masaki, and Ishikawa, Tetsuya. Fri . "Evaluation of In-Vacuum Imaging Plate Detector for X-Ray Diffraction Microscopy". United States. doi:10.1063/1.2436321.
@article{osti_21049284,
title = {Evaluation of In-Vacuum Imaging Plate Detector for X-Ray Diffraction Microscopy},
author = {Nishino, Yoshinori and Takahashi, Yukio and Yamamoto, Masaki and Ishikawa, Tetsuya},
abstractNote = {We performed evaluation tests of a newly developed in-vacuum imaging plate (IP) detector for x-ray diffraction microscopy. IP detectors have advantages over direct x-ray detection charge-coupled device (CCD) detectors, which have been commonly used in x-ray diffraction microscopy experiments, in the capabilities for a high photon count and for a wide area. The detector system contains two IPs to make measurement efficient by recording data with the one while reading or erasing the other. We compared speckled diffraction patterns of single particles taken with the IP and a direct x-ray detection CCD. The IP was inferior to the CCD in spatial resolution and in signal-to-noise ratio at a low photon count.},
doi = {10.1063/1.2436321},
journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 879,
place = {United States},
year = {2007},
month = {1}
}